二氯二氟甲烷(R12)和四氟乙烷(R134)总电子冲击电离截面的理论测定

F. Tang, Jiayu Xiong, Boya Zhang, Qishen Lv, Xingwen Li
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引用次数: 0

摘要

自20世纪60年代以来,SF6就被用作高压电器的绝缘和灭弧介质。然而,由于SF6气体的高全球变暖潜能值(GWP),需要SF6的替代品。考虑到环境问题,R12和R134气体具有良好的介电性能,是SF6作为绝缘介质的良好替代品。为了进一步研究这些气体中的电离过程,用Deutsch-Märk (DM)及其修正方法计算了电子冲击电离截面。通过从头计算确定了R12和R134的分子结构和分子轨道组成。研究结果为两种SF6替代气体提供了重要参考。
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Theoretical Determination of Total Electron-impact Ionization Cross Sections of Dichlorodifluoromethane (R12) and Tetrafluoroethane (R134)
SF6 has been employed as insulation and arc-quenching medium in high voltage apparatus since the 1960s. However, due to the high global warming potential (GWP) of SF6 gas, the alternative to SF6 is required. R12 and R134 gases offer good dielectric properties to be good replacements of SF6 as insulation medium considering the environmental concerns. In order to further investigate the ionization processes in those gases, the electron-impact ionization cross sections are calculated by Deutsch-Märk (DM) and its modified methods. The molecular structures and the molecular orbital compositions of R12 and R134 were determined by ab initio calculation. The results give important reference for the two SF6 substitute gases.
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