用RISC微控制器进行内存测试

2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) Pub Date : 2010-03-08 DOI:10.1109/DATE.2010.5457210

A. V. Goor, G. Gaydadjiev, S. Hamdioui

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引用次数: 31

摘要

许多系统是基于嵌入式微控制器的。生产和开机测试的应用需求，包括内存测试。由于低端微控制器可能没有内存BIST, CPU将是执行至少Power-On测试的唯一资源。本文介绍了基于cpu的高速内存测试存在的问题、解决方案和局限性，并以ATMEL RISC单片机为例进行了说明。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Memory testing with a RISC microcontroller

Many systems are based on embedded microcontrollers. Applications demand for production and Power-On testing, including memory testing. Because low-end microcontrollers may not have memory BIST, the CPU will be the only resource to perform at least the Power-On tests. This paper shows the problems, solutions and limitations of CPU-based at-speed memory testing, illustrated with examples from the ATMEL RISC microcontroller.

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2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)

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