{"title":"利用反相显微镜和扫描系统进行毫米波成像","authors":"Zucun Zhang, W. Dou","doi":"10.1109/IMWS.2008.4782288","DOIUrl":null,"url":null,"abstract":"In this paper, firstly, focal field of Reverse-Microscope System (RMS) at millimeter wavelengths is analyzed, The contour diagram of electric field in the focal plane of RMS when the linearly polarized plane wave impact on it with different incident angles is calculated with ray-tracing method and Stratton-Chu vector diffraction integral formula. Then we add a scanning system in front of the RMS to form a Scanning Reverse-Microscope System (SRMS). The contour diagram of the SRMS is also calculated. The numerical results are very useful for us to design a millimeter-wave imaging system with low cost and high performance in our next work.","PeriodicalId":257679,"journal":{"name":"2008 IEEE MTT-S International Microwave Workshop Series on Art of Miniaturizing RF and Microwave Passive Components","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Millimeter-Wave Imaging Using Reverse-Microscope and Scanning System\",\"authors\":\"Zucun Zhang, W. Dou\",\"doi\":\"10.1109/IMWS.2008.4782288\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, firstly, focal field of Reverse-Microscope System (RMS) at millimeter wavelengths is analyzed, The contour diagram of electric field in the focal plane of RMS when the linearly polarized plane wave impact on it with different incident angles is calculated with ray-tracing method and Stratton-Chu vector diffraction integral formula. Then we add a scanning system in front of the RMS to form a Scanning Reverse-Microscope System (SRMS). The contour diagram of the SRMS is also calculated. The numerical results are very useful for us to design a millimeter-wave imaging system with low cost and high performance in our next work.\",\"PeriodicalId\":257679,\"journal\":{\"name\":\"2008 IEEE MTT-S International Microwave Workshop Series on Art of Miniaturizing RF and Microwave Passive Components\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE MTT-S International Microwave Workshop Series on Art of Miniaturizing RF and Microwave Passive Components\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMWS.2008.4782288\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE MTT-S International Microwave Workshop Series on Art of Miniaturizing RF and Microwave Passive Components","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMWS.2008.4782288","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Millimeter-Wave Imaging Using Reverse-Microscope and Scanning System
In this paper, firstly, focal field of Reverse-Microscope System (RMS) at millimeter wavelengths is analyzed, The contour diagram of electric field in the focal plane of RMS when the linearly polarized plane wave impact on it with different incident angles is calculated with ray-tracing method and Stratton-Chu vector diffraction integral formula. Then we add a scanning system in front of the RMS to form a Scanning Reverse-Microscope System (SRMS). The contour diagram of the SRMS is also calculated. The numerical results are very useful for us to design a millimeter-wave imaging system with low cost and high performance in our next work.
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