高斯光束和顶帽光束在LIDT测试中的比较

L. Jensen, M. Jupé, K. Starke, D. Ristau, W. Riede, P. Allenspacher
{"title":"高斯光束和顶帽光束在LIDT测试中的比较","authors":"L. Jensen, M. Jupé, K. Starke, D. Ristau, W. Riede, P. Allenspacher","doi":"10.1117/12.752873","DOIUrl":null,"url":null,"abstract":"The ISO 11254 standard for LIDT tests suggests two possible spatial beam profiles for damage testing. Accordingly, an equal set of samples was tested with a Gaussian TEM00 as well as with a top-hat beam profile at different beam diameters. It was found that for the investigated HfO2/SiO2 high reflectors there was no threshold dependence on the beam diameter at 355nm. The damage threshold values measured with the Gaussian and the top-hat beam were in good correlation.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Comparison of Gaussian and top-hat beam profiles in LIDT testing\",\"authors\":\"L. Jensen, M. Jupé, K. Starke, D. Ristau, W. Riede, P. Allenspacher\",\"doi\":\"10.1117/12.752873\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The ISO 11254 standard for LIDT tests suggests two possible spatial beam profiles for damage testing. Accordingly, an equal set of samples was tested with a Gaussian TEM00 as well as with a top-hat beam profile at different beam diameters. It was found that for the investigated HfO2/SiO2 high reflectors there was no threshold dependence on the beam diameter at 355nm. The damage threshold values measured with the Gaussian and the top-hat beam were in good correlation.\",\"PeriodicalId\":204978,\"journal\":{\"name\":\"SPIE Laser Damage\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-12-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"SPIE Laser Damage\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.752873\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"SPIE Laser Damage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.752873","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

ISO 11254 LIDT测试标准提出了两种可能用于损伤测试的空间梁廓形。因此,在不同光束直径下,用高斯TEM00和顶帽光束轮廓测试了一组相等的样品。研究发现,对于所研究的HfO2/SiO2高反射镜,在355nm处光束直径没有阈值依赖性。用高斯函数和顶帽梁测量的损伤阈值具有良好的相关性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Comparison of Gaussian and top-hat beam profiles in LIDT testing
The ISO 11254 standard for LIDT tests suggests two possible spatial beam profiles for damage testing. Accordingly, an equal set of samples was tested with a Gaussian TEM00 as well as with a top-hat beam profile at different beam diameters. It was found that for the investigated HfO2/SiO2 high reflectors there was no threshold dependence on the beam diameter at 355nm. The damage threshold values measured with the Gaussian and the top-hat beam were in good correlation.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Impact of particle shape on the laser-contaminant interaction induced damage on the protective capping layer of 1ω high reflector mirror coatings Direct comparison of statistical damage frequency method and raster scan procedure Refined metrology of spatio-temporal dynamics of nanosecond laser pulses Characterization of damage precursor density from laser damage probability measurements with non-Gaussian beams Direct absorption measurements in thin rods and optical fibers
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1