N. Kaneko, T. Oe, Wan-Seop Kim, D. Chae, R. Elmquist, M. Kraft
{"title":"在KRISS, NIST和NMIJ三方比较试点研究中镍铬基金属箔标准电阻器的输运效应","authors":"N. Kaneko, T. Oe, Wan-Seop Kim, D. Chae, R. Elmquist, M. Kraft","doi":"10.1109/CPEM.2014.6898501","DOIUrl":null,"url":null,"abstract":"This paper describes a study on the transportation effect using four 100 Ω standard resistors of a new construction. All resistors have been transported by air: two of the resistors in hand-carried luggage and the other two by normal air freight. The standards have been measured by three national metrology institutes, the Korean Research Institute of Standards, the National Institute of Standards and Technology in USA and the National Metrology Institute of Japan by means of their primary national standards based on the quantum Hall effect. No noticeable difference between the two transportation methods has been detected within a standard uncertainty of 0.01 μΩ/Ω and performance suitable for international comparisons of this type of resistors has been demonstrated.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Transportation effect of Ni-Cr based metal-foil standard resistors in a trilateral comparison pilot study between KRISS, NIST, and NMIJ\",\"authors\":\"N. Kaneko, T. Oe, Wan-Seop Kim, D. Chae, R. Elmquist, M. Kraft\",\"doi\":\"10.1109/CPEM.2014.6898501\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a study on the transportation effect using four 100 Ω standard resistors of a new construction. All resistors have been transported by air: two of the resistors in hand-carried luggage and the other two by normal air freight. The standards have been measured by three national metrology institutes, the Korean Research Institute of Standards, the National Institute of Standards and Technology in USA and the National Metrology Institute of Japan by means of their primary national standards based on the quantum Hall effect. No noticeable difference between the two transportation methods has been detected within a standard uncertainty of 0.01 μΩ/Ω and performance suitable for international comparisons of this type of resistors has been demonstrated.\",\"PeriodicalId\":256575,\"journal\":{\"name\":\"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.2014.6898501\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.2014.6898501","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transportation effect of Ni-Cr based metal-foil standard resistors in a trilateral comparison pilot study between KRISS, NIST, and NMIJ
This paper describes a study on the transportation effect using four 100 Ω standard resistors of a new construction. All resistors have been transported by air: two of the resistors in hand-carried luggage and the other two by normal air freight. The standards have been measured by three national metrology institutes, the Korean Research Institute of Standards, the National Institute of Standards and Technology in USA and the National Metrology Institute of Japan by means of their primary national standards based on the quantum Hall effect. No noticeable difference between the two transportation methods has been detected within a standard uncertainty of 0.01 μΩ/Ω and performance suitable for international comparisons of this type of resistors has been demonstrated.