基于广义积分变换的早期设计全芯片热分析

Pei-Yu Huang, Chih-Kang Lin, Yu-Min Lee
{"title":"基于广义积分变换的早期设计全芯片热分析","authors":"Pei-Yu Huang, Chih-Kang Lin, Yu-Min Lee","doi":"10.1109/ASPDAC.2008.4483995","DOIUrl":null,"url":null,"abstract":"The capability of predicting the temperature profile is critically important for circuit timing estimation, leakage reduction, power estimation, hotspot avoidance, and reliability concerns during modern IC designs. This paper presents an accurate and fast analytical full-chip thermal simulator for the early-stage temperature-aware chip design. By using the technique of generalized integral transforms (GIT), our proposed method can accurately estimate the temperature distribution of full-chip with very small truncation points of bases in the spatial domain. We also develop a fast Fourier transform (FFT) like evaluating algorithm to efficiently evaluate the temperature distribution. Experimental results confirm that our GIT based analyzer can achieve an order of magnitude speedup compared with a highly efficient Green's function based method.","PeriodicalId":277556,"journal":{"name":"2008 Asia and South Pacific Design Automation Conference","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-01-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"22","resultStr":"{\"title\":\"Full-chip thermal analysis for the early design stage via generalized integral transforms\",\"authors\":\"Pei-Yu Huang, Chih-Kang Lin, Yu-Min Lee\",\"doi\":\"10.1109/ASPDAC.2008.4483995\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The capability of predicting the temperature profile is critically important for circuit timing estimation, leakage reduction, power estimation, hotspot avoidance, and reliability concerns during modern IC designs. This paper presents an accurate and fast analytical full-chip thermal simulator for the early-stage temperature-aware chip design. By using the technique of generalized integral transforms (GIT), our proposed method can accurately estimate the temperature distribution of full-chip with very small truncation points of bases in the spatial domain. We also develop a fast Fourier transform (FFT) like evaluating algorithm to efficiently evaluate the temperature distribution. Experimental results confirm that our GIT based analyzer can achieve an order of magnitude speedup compared with a highly efficient Green's function based method.\",\"PeriodicalId\":277556,\"journal\":{\"name\":\"2008 Asia and South Pacific Design Automation Conference\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-01-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"22\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 Asia and South Pacific Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.2008.4483995\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Asia and South Pacific Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.2008.4483995","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 22

摘要

在现代IC设计中,预测温度分布的能力对于电路时序估计,减少泄漏,功率估计,热点避免和可靠性问题至关重要。本文提出了一种精确、快速的全芯片热模拟器,用于早期温度感知芯片的设计。该方法利用广义积分变换技术,可以在极小的碱基截断点的情况下准确估计出全芯片的温度分布。我们还开发了一种快速傅立叶变换(FFT)评估算法来有效地评估温度分布。实验结果表明,与基于格林函数的高效方法相比,基于GIT的分析仪可以实现一个数量级的加速。
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Full-chip thermal analysis for the early design stage via generalized integral transforms
The capability of predicting the temperature profile is critically important for circuit timing estimation, leakage reduction, power estimation, hotspot avoidance, and reliability concerns during modern IC designs. This paper presents an accurate and fast analytical full-chip thermal simulator for the early-stage temperature-aware chip design. By using the technique of generalized integral transforms (GIT), our proposed method can accurately estimate the temperature distribution of full-chip with very small truncation points of bases in the spatial domain. We also develop a fast Fourier transform (FFT) like evaluating algorithm to efficiently evaluate the temperature distribution. Experimental results confirm that our GIT based analyzer can achieve an order of magnitude speedup compared with a highly efficient Green's function based method.
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