CMOS卡开故障的现代视角

2009 10th Latin American Test Workshop Pub Date : 2009-03-02 DOI:10.1109/LATW.2009.4813818

Roberto Gómez, V. Champac, C. Hawkins, J. Segura

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引用次数: 6

摘要

卡开故障(SOF)是CMOS技术特有的一种困难的硬故障机制[1-3]。它的检测需要一个特定的2向量对来检查逻辑门中的每个晶体管在漏极和/或源极中是否存在开路缺陷。这个缺陷无法100%检测到。我们将证明这种大多被抛弃的失效机制与现代集成电路非常相关。纳米级技术中的电流泄漏对该故障的行为有显著影响。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A modern look at the CMOS stuck-open fault

The stuck-open fault (SOF) is a difficult, hard failure mechanism unique to CMOS technology [1–3]. Its detection requires a specific 2-vector pair that examines each transistor in the logic gate for an open defect in its drain and/or source. This defect defies a guaranteed 100% detection. We will show that this mostly discarded failure mechanism is very relevant to modern ICs. Current leakage in nanoscale technologies influence significantly the behavior of this fault.

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2009 10th Latin American Test Workshop

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