{"title":"神经网络容错建模","authors":"L. Belfore, B.W. Johnson, J. Aylor","doi":"10.1109/IECON.1989.69723","DOIUrl":null,"url":null,"abstract":"The authors present an analytical technique for assessing the fault tolerance of neural networks. The basis of the technique is developed through an analogy with magnetic spin systems using statistical mechanics. It is shown that neural networks can be analyzed using statistical mechanics. Simulated results are compared with analytical results, showing that the analytical model does indeed conform to the simulation model. The primary example presented is an associative memory.<<ETX>>","PeriodicalId":384081,"journal":{"name":"15th Annual Conference of IEEE Industrial Electronics Society","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Modeling of fault tolerance in neural networks\",\"authors\":\"L. Belfore, B.W. Johnson, J. Aylor\",\"doi\":\"10.1109/IECON.1989.69723\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present an analytical technique for assessing the fault tolerance of neural networks. The basis of the technique is developed through an analogy with magnetic spin systems using statistical mechanics. It is shown that neural networks can be analyzed using statistical mechanics. Simulated results are compared with analytical results, showing that the analytical model does indeed conform to the simulation model. The primary example presented is an associative memory.<<ETX>>\",\"PeriodicalId\":384081,\"journal\":{\"name\":\"15th Annual Conference of IEEE Industrial Electronics Society\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"15th Annual Conference of IEEE Industrial Electronics Society\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IECON.1989.69723\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"15th Annual Conference of IEEE Industrial Electronics Society","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IECON.1989.69723","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The authors present an analytical technique for assessing the fault tolerance of neural networks. The basis of the technique is developed through an analogy with magnetic spin systems using statistical mechanics. It is shown that neural networks can be analyzed using statistical mechanics. Simulated results are compared with analytical results, showing that the analytical model does indeed conform to the simulation model. The primary example presented is an associative memory.<>