{"title":"电阻式桥接故障可测双轨检测仪的设计","authors":"M. Olson, Xiaoling Sun","doi":"10.1109/CCECE.1995.528090","DOIUrl":null,"url":null,"abstract":"This paper describes the design of a built-in current sensor that is used to enhance the resistive bridging fault detectability of a static CMOS TSC two-rail checker. The design and operation of the sensor is discussed. The performance of the sensor-equipped checker is evaluated and compared to a previously designed checker.","PeriodicalId":158581,"journal":{"name":"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"On the design of a resistive bridging fault testable two-rail checker\",\"authors\":\"M. Olson, Xiaoling Sun\",\"doi\":\"10.1109/CCECE.1995.528090\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the design of a built-in current sensor that is used to enhance the resistive bridging fault detectability of a static CMOS TSC two-rail checker. The design and operation of the sensor is discussed. The performance of the sensor-equipped checker is evaluated and compared to a previously designed checker.\",\"PeriodicalId\":158581,\"journal\":{\"name\":\"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-09-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCECE.1995.528090\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCECE.1995.528090","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On the design of a resistive bridging fault testable two-rail checker
This paper describes the design of a built-in current sensor that is used to enhance the resistive bridging fault detectability of a static CMOS TSC two-rail checker. The design and operation of the sensor is discussed. The performance of the sensor-equipped checker is evaluated and compared to a previously designed checker.
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