研讨会主席和联席主席的发言

R. P. D. Vries, Kuen-Jong Lee, T. Cheng, Yao-Wen Chang, Ting-Ting Hwang, Cheng-Wen Wu
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引用次数: 0

摘要

超大规模集成电路设计、自动化和测试国际研讨会(VLSI- dat)是由2006年极具影响力的超大规模集成电路技术、系统和应用国际研讨会(VLSI- tsa)衍生而来的。每年,科学家和工程师都会讨论并展示最先进的技术和行业未来的宏观发展。由于台湾不仅在全球半导体产业中占据突出地位,而且在通信和信息产品的IC设计技术方面也日益具有全球竞争力,因此VLSI-DAT研讨会变得更加重要。
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Words from symposium chair and co-chair
The International Symposium on VLSI Design, Automation and Test (VLSI-DAT), spun-off from the influential International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) in 2006, has stepped into the 4 year. Every year, scientists and engineers discuss and present the state-of-the-art technology and macro development of the industry's future. The VLSI-DAT symposium is becoming more significant, since Taiwan not only occupies a prominent position in the global semiconductor industry, but also is increasingly competitive globally in IC design technology for communication and information products.
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