集成磁性薄膜的片内解耦测量

W. Kodate, Y. Endo, M. Yamaguchi
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引用次数: 2

摘要

评价了磁性薄膜作为片上噪声抑制器件的性能。采用在90nm设计测试元件组(TEG)芯片上实现的微型线圈作为噪声发射和接收。差分传输参数Sdd21被评估为电感噪声内去耦的度量。磁膜用于频率选择性噪声去耦。耦合在偏离固有频率的铁磁共振(FMR)频率处得到最大支持,偏离的程度可以用特征长度来计算。结果表明,所提出的方法可用于表征GHz范围内的IC片级噪声抑制器。
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On-chip intra decoupling measurements for integrated magnetic thin film
Performance of magnetic thin-film is evaluated as a candidate for on-chip noise suppressor. Miniature loops coils implemented on a 90 nm design test element group (TEG) chip are used as the noise transmitter and receiver. Differential transmission parameter Sdd21 is evaluated as a measure of inductive noise intra-decoupling. Magnetic film is useful for frequency selective noise decoupler. The coupling is supported most at the ferromagnetic resonance (FMR) frequency, which is deviated from its intrinsic frequency and the degree of deviation can be calculated by using characteristic length. These results demonstrate that the proposed method is useful to characterize the IC chip level noise suppressor in the GHz range.
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