基于元胞自动机的星型拓扑自测试实现

Afroz Fatima, S. Waseem
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引用次数: 3

摘要

内置自测试(BIST)是一种以提供片上测试功能而闻名的技术,在当今的片上系统(SoC)设计中得到了广泛的应用。随着复杂SoC的片上网络(NoC)通信的发展,对容错系统的需求迅速增加。为了设计一个好的BIST架构,本文提出了一种基于元胞自动机规则45的星型拓扑NoC的BIST架构。为提出的体系结构生成功耗、资源利用率和时间报告,并与最流行和广泛使用的基于LFSR的BIST体系结构进行比较。本文的结果和讨论表明,与同类体系结构相比,所提出的体系结构具有优势。
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Cellular Automata based Built-In-Self Test implementation for Star Topology NoC
Built-In-Self Test (BIST) being one of the techniques which are well known for their ability of providing on-chip testability feature, attracts its usage in today's System-on-Chip (SoC) designs. With the evolution of Network-on-Chip (NoC) communication for complex SoC, the need for fault tolerant systems have increased at a speed. In an attempt to design a good BIST architecture, this paper proposes a Cellular Automata Rule 45 based BIST architecture for star topology NoC. Power, resource utilization and timing reports are generated for the proposed architecture and are compared against the most popular and widely used LFSR based BIST architecture. The results and discussion in this paper put forward the advantages of the proposed architecture when compared to its counterpart.
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