K. Yamamoto, M. Muramatsu, K. Yamamura, M. Ohmura, H. Utsuyama, H. Anzai, Y. Hayama
{"title":"双面硅条探测器的稳定性和可靠性","authors":"K. Yamamoto, M. Muramatsu, K. Yamamura, M. Ohmura, H. Utsuyama, H. Anzai, Y. Hayama","doi":"10.1109/NSSMIC.1992.301117","DOIUrl":null,"url":null,"abstract":"Evaluation devices of a double-sided silicon strip detector have been fabricated. These devices are basically AC-coupled and mainly designed to study the stability and reliability of a coupling capacitor to maintain low noise, high breakdown voltage. A hot electron analyzer was used to check the relation between breakdown voltage and charge injection in the coupling capacitor.<<ETX>>","PeriodicalId":447239,"journal":{"name":"IEEE Conference on Nuclear Science Symposium and Medical Imaging","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Stability and reliability of the double sided silicon strip detector\",\"authors\":\"K. Yamamoto, M. Muramatsu, K. Yamamura, M. Ohmura, H. Utsuyama, H. Anzai, Y. Hayama\",\"doi\":\"10.1109/NSSMIC.1992.301117\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Evaluation devices of a double-sided silicon strip detector have been fabricated. These devices are basically AC-coupled and mainly designed to study the stability and reliability of a coupling capacitor to maintain low noise, high breakdown voltage. A hot electron analyzer was used to check the relation between breakdown voltage and charge injection in the coupling capacitor.<<ETX>>\",\"PeriodicalId\":447239,\"journal\":{\"name\":\"IEEE Conference on Nuclear Science Symposium and Medical Imaging\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-10-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Conference on Nuclear Science Symposium and Medical Imaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSSMIC.1992.301117\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Conference on Nuclear Science Symposium and Medical Imaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSSMIC.1992.301117","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Stability and reliability of the double sided silicon strip detector
Evaluation devices of a double-sided silicon strip detector have been fabricated. These devices are basically AC-coupled and mainly designed to study the stability and reliability of a coupling capacitor to maintain low noise, high breakdown voltage. A hot electron analyzer was used to check the relation between breakdown voltage and charge injection in the coupling capacitor.<>
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