{"title":"毫米波天线方向图测量中遇到的问题及解决方法","authors":"Yonglei Li, Hongmei Tang, Xin Liu, Tiexing Wang","doi":"10.1109/IIKI.2016.32","DOIUrl":null,"url":null,"abstract":"In a lot of microwave system development process, we often need to test antenna pattern be loaded in the system and provide support to carry out the relevant system design and testing. This article focuses on the issue during the millimeter wave antenna pattern test encountered and the measures taken.","PeriodicalId":371106,"journal":{"name":"2016 International Conference on Identification, Information and Knowledge in the Internet of Things (IIKI)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Problems and Solutions Encountered in the Measurement of Millimeter Wave Antenna Pattern\",\"authors\":\"Yonglei Li, Hongmei Tang, Xin Liu, Tiexing Wang\",\"doi\":\"10.1109/IIKI.2016.32\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In a lot of microwave system development process, we often need to test antenna pattern be loaded in the system and provide support to carry out the relevant system design and testing. This article focuses on the issue during the millimeter wave antenna pattern test encountered and the measures taken.\",\"PeriodicalId\":371106,\"journal\":{\"name\":\"2016 International Conference on Identification, Information and Knowledge in the Internet of Things (IIKI)\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Conference on Identification, Information and Knowledge in the Internet of Things (IIKI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IIKI.2016.32\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Identification, Information and Knowledge in the Internet of Things (IIKI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IIKI.2016.32","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Problems and Solutions Encountered in the Measurement of Millimeter Wave Antenna Pattern
In a lot of microwave system development process, we often need to test antenna pattern be loaded in the system and provide support to carry out the relevant system design and testing. This article focuses on the issue during the millimeter wave antenna pattern test encountered and the measures taken.