异步时序电路的新型扫描设计

AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360) Pub Date : 1999-08-23 DOI:10.1109/APASIC.1999.824102

Y. Kang, Kyung-Hoi Huh, Sungho Kang

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引用次数: 15

摘要

本文提出了一种基于微管道方法的异步时序电路卡滞故障和延迟故障检测新方案。在异步微管道环境中，该扫描方法能够以较小的面积开销获得高的路径延迟故障和卡滞故障的故障覆盖率，并且易于扩展内置自检测等应用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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New scan design of asynchronous sequential circuits

In this paper a new scan design for detection of stuck-at faults and delay faults in asynchronous sequential circuits based on the micropipeline approach is proposed. This new scan methodology can gain the high fault coverage of path delay fault as well as stuck-at fault with the small area overhead in the asynchronous micropipeline environments and easily expand the application such as built-in self testing.

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AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360)

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