{"title":"硫族化合物(Ge33As12Se55)薄膜中的体积相元素","authors":"Alexandre Joërg, M. Lequime, J. Lumeau","doi":"10.1117/12.2191372","DOIUrl":null,"url":null,"abstract":"Recording of binary volumetric diffractive optical elements within a 13 μm thick photosensitive chalcogenide layer using an innovative exposure set-up based on digital micro-mirrors devices is demonstrated. Different examples of beam transformations are shown such as the conversion of Gaussian beam into higher order modes or top-hat beam shapers.","PeriodicalId":212434,"journal":{"name":"SPIE Optical Systems Design","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Volume phase elements in chalcogenide (Ge33As12Se55) thin films\",\"authors\":\"Alexandre Joërg, M. Lequime, J. Lumeau\",\"doi\":\"10.1117/12.2191372\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Recording of binary volumetric diffractive optical elements within a 13 μm thick photosensitive chalcogenide layer using an innovative exposure set-up based on digital micro-mirrors devices is demonstrated. Different examples of beam transformations are shown such as the conversion of Gaussian beam into higher order modes or top-hat beam shapers.\",\"PeriodicalId\":212434,\"journal\":{\"name\":\"SPIE Optical Systems Design\",\"volume\":\"49 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-09-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"SPIE Optical Systems Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2191372\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"SPIE Optical Systems Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2191372","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Volume phase elements in chalcogenide (Ge33As12Se55) thin films
Recording of binary volumetric diffractive optical elements within a 13 μm thick photosensitive chalcogenide layer using an innovative exposure set-up based on digital micro-mirrors devices is demonstrated. Different examples of beam transformations are shown such as the conversion of Gaussian beam into higher order modes or top-hat beam shapers.
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