{"title":"rs触发器框架下场效应异质晶体管集成率的提高","authors":"E. Pankratov","doi":"10.33545/27076636.2023.v4.i1a.82","DOIUrl":null,"url":null,"abstract":"In this paper we introduce an approach to increase integration rate of field-effect heterotransistors framework RS-trigger. Framework the approach we consider a heterostructure with special configuration. Several specific areas of the heterostructure should be doped by diffusion or ion implantation. Annealing of dopant and/or radiation defects should be optimized.","PeriodicalId":127185,"journal":{"name":"International Journal of Computing, Programming and Database Management","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On increasing of integration rate of field-effect heterotransistors in the framework of RS-trigger\",\"authors\":\"E. Pankratov\",\"doi\":\"10.33545/27076636.2023.v4.i1a.82\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we introduce an approach to increase integration rate of field-effect heterotransistors framework RS-trigger. Framework the approach we consider a heterostructure with special configuration. Several specific areas of the heterostructure should be doped by diffusion or ion implantation. Annealing of dopant and/or radiation defects should be optimized.\",\"PeriodicalId\":127185,\"journal\":{\"name\":\"International Journal of Computing, Programming and Database Management\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Computing, Programming and Database Management\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.33545/27076636.2023.v4.i1a.82\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Computing, Programming and Database Management","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.33545/27076636.2023.v4.i1a.82","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On increasing of integration rate of field-effect heterotransistors in the framework of RS-trigger
In this paper we introduce an approach to increase integration rate of field-effect heterotransistors framework RS-trigger. Framework the approach we consider a heterostructure with special configuration. Several specific areas of the heterostructure should be doped by diffusion or ion implantation. Annealing of dopant and/or radiation defects should be optimized.