具有低级和高级决策图的数字系统的诊断建模

2013 14th Latin American Test Workshop - LATW Pub Date : 2013-04-03 DOI:10.1109/LATW.2013.6562656

R. Ubar

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摘要

数字系统的复杂性在不断增长。这导致了现代VLSI系统中设计错误和制造故障的增加趋势。因此，验证和测试将继续作为VLSI系统上市时间、可靠性和成本的关键因素占据主导地位。

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Diagnostic modeling of digital systems with low- and high-level decision diagrams

The complexity of digital systems is constantly growing. This has resulted in an increasing trend in design errors and manufacturing faults in modern VLSI systems. As the result, verification and test will continue to dominate as crucial factors in time-to-market, reliability, and cost of VLSI systems.

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2013 14th Latin American Test Workshop - LATW

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