N. Prabhu, Desmond Loy Jia Jun, P. Dananjaya, E. Toh, W. Lew, N. Raghavan
{"title":"基于宽遵从性RRAM器件的深度学习神经网络功率与预测精度权衡研究","authors":"N. Prabhu, Desmond Loy Jia Jun, P. Dananjaya, E. Toh, W. Lew, N. Raghavan","doi":"10.1109/ISNE.2019.8896449","DOIUrl":null,"url":null,"abstract":"In this work, the quantitative impact of variability in the low and high resistance state distributions of Hafnium oxide based RRAM on the prediction accuracy of deep learning neural networks is explored over a wide range of current compliance ranging from 2 to 500micro Ampere. The device power versus prediction accuracy trade-off trend is examined for such a wide range of compliance for the first time. The weights of one of the layers of the convolutional neural network (CNN) are represented by the floating point binary representation where the binary bits are configured using the RRAM resistance distribution data on an AlexNet platform.","PeriodicalId":405565,"journal":{"name":"2019 8th International Symposium on Next Generation Electronics (ISNE)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Exploring the Power – Prediction Accuracy Trade-Off in a Deep Learning Neural Network using Wide Compliance RRAM Device\",\"authors\":\"N. Prabhu, Desmond Loy Jia Jun, P. Dananjaya, E. Toh, W. Lew, N. Raghavan\",\"doi\":\"10.1109/ISNE.2019.8896449\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, the quantitative impact of variability in the low and high resistance state distributions of Hafnium oxide based RRAM on the prediction accuracy of deep learning neural networks is explored over a wide range of current compliance ranging from 2 to 500micro Ampere. The device power versus prediction accuracy trade-off trend is examined for such a wide range of compliance for the first time. The weights of one of the layers of the convolutional neural network (CNN) are represented by the floating point binary representation where the binary bits are configured using the RRAM resistance distribution data on an AlexNet platform.\",\"PeriodicalId\":405565,\"journal\":{\"name\":\"2019 8th International Symposium on Next Generation Electronics (ISNE)\",\"volume\":\"75 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 8th International Symposium on Next Generation Electronics (ISNE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISNE.2019.8896449\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 8th International Symposium on Next Generation Electronics (ISNE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISNE.2019.8896449","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Exploring the Power – Prediction Accuracy Trade-Off in a Deep Learning Neural Network using Wide Compliance RRAM Device
In this work, the quantitative impact of variability in the low and high resistance state distributions of Hafnium oxide based RRAM on the prediction accuracy of deep learning neural networks is explored over a wide range of current compliance ranging from 2 to 500micro Ampere. The device power versus prediction accuracy trade-off trend is examined for such a wide range of compliance for the first time. The weights of one of the layers of the convolutional neural network (CNN) are represented by the floating point binary representation where the binary bits are configured using the RRAM resistance distribution data on an AlexNet platform.