数百万实例SoC设计的约束分析与调试

Long Fei, L. Mize, Cho Moon, Bill Mullen, Sonia Singhal
{"title":"数百万实例SoC设计的约束分析与调试","authors":"Long Fei, L. Mize, Cho Moon, Bill Mullen, Sonia Singhal","doi":"10.1109/ISQED.2010.5450540","DOIUrl":null,"url":null,"abstract":"Timing constraints are used by implementation tools in all design stages in modern design flows. With the growing complexity of designs and constraints, it is increasingly challenging to identify, diagnose, and fix constraint problems. In this paper, we present the technology of an interactive constraint debugger that automatically checks constraint problems, and provides context-sensitive diagnosis and fix suggestions. Our extensive user feedback shows that the tool significantly improves designer productivity.","PeriodicalId":369046,"journal":{"name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Constraint analysis and debugging for multi-million instance SoC designs\",\"authors\":\"Long Fei, L. Mize, Cho Moon, Bill Mullen, Sonia Singhal\",\"doi\":\"10.1109/ISQED.2010.5450540\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Timing constraints are used by implementation tools in all design stages in modern design flows. With the growing complexity of designs and constraints, it is increasingly challenging to identify, diagnose, and fix constraint problems. In this paper, we present the technology of an interactive constraint debugger that automatically checks constraint problems, and provides context-sensitive diagnosis and fix suggestions. Our extensive user feedback shows that the tool significantly improves designer productivity.\",\"PeriodicalId\":369046,\"journal\":{\"name\":\"2010 11th International Symposium on Quality Electronic Design (ISQED)\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-03-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 11th International Symposium on Quality Electronic Design (ISQED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2010.5450540\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 11th International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2010.5450540","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

在现代设计流程的所有设计阶段,实现工具都使用时间约束。随着设计和约束的日益复杂,识别、诊断和修复约束问题变得越来越具有挑战性。在本文中,我们提出了一种交互式约束调试器技术,它可以自动检查约束问题,并提供上下文敏感的诊断和修复建议。我们广泛的用户反馈表明,该工具显着提高了设计师的工作效率。
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Constraint analysis and debugging for multi-million instance SoC designs
Timing constraints are used by implementation tools in all design stages in modern design flows. With the growing complexity of designs and constraints, it is increasingly challenging to identify, diagnose, and fix constraint problems. In this paper, we present the technology of an interactive constraint debugger that automatically checks constraint problems, and provides context-sensitive diagnosis and fix suggestions. Our extensive user feedback shows that the tool significantly improves designer productivity.
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