{"title":"实际设计中的Bug分析及相应的误差模型","authors":"Tao Lv, Tong Xu, Yang Zhao, Huawei Li, Xiaowei Li","doi":"10.1109/HLDVT.2007.4392788","DOIUrl":null,"url":null,"abstract":"This paper presents the item-missing error model. It stems from the analysis of real bugs that are collected in two market-oriented projects: (1) the AMBA interface of a general-purpose microprocessor IP core; (2) a wireless sensor network oriented embedded processor. The bugs are analyzed via code structure comparison, and it is found that item-missing errors merit attention. The test generation method for item-missing error model is proposed. Structural information obtained from this error model is helpful to reach a greater probability of bug detection than that in random-generation verification with only functional constraints. Finally, the proposed test method is applied in verification of our designs, and experimental results demonstrate the effectiveness of this method.","PeriodicalId":339324,"journal":{"name":"2007 IEEE International High Level Design Validation and Test Workshop","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Bug analysis and corresponding error models in real designs\",\"authors\":\"Tao Lv, Tong Xu, Yang Zhao, Huawei Li, Xiaowei Li\",\"doi\":\"10.1109/HLDVT.2007.4392788\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the item-missing error model. It stems from the analysis of real bugs that are collected in two market-oriented projects: (1) the AMBA interface of a general-purpose microprocessor IP core; (2) a wireless sensor network oriented embedded processor. The bugs are analyzed via code structure comparison, and it is found that item-missing errors merit attention. The test generation method for item-missing error model is proposed. Structural information obtained from this error model is helpful to reach a greater probability of bug detection than that in random-generation verification with only functional constraints. Finally, the proposed test method is applied in verification of our designs, and experimental results demonstrate the effectiveness of this method.\",\"PeriodicalId\":339324,\"journal\":{\"name\":\"2007 IEEE International High Level Design Validation and Test Workshop\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International High Level Design Validation and Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HLDVT.2007.4392788\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International High Level Design Validation and Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HLDVT.2007.4392788","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Bug analysis and corresponding error models in real designs
This paper presents the item-missing error model. It stems from the analysis of real bugs that are collected in two market-oriented projects: (1) the AMBA interface of a general-purpose microprocessor IP core; (2) a wireless sensor network oriented embedded processor. The bugs are analyzed via code structure comparison, and it is found that item-missing errors merit attention. The test generation method for item-missing error model is proposed. Structural information obtained from this error model is helpful to reach a greater probability of bug detection than that in random-generation verification with only functional constraints. Finally, the proposed test method is applied in verification of our designs, and experimental results demonstrate the effectiveness of this method.
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