Fault grading, a measure of logic simulation integrity

It is argued that although fault grading is generally used as a measure of the completeness of the test program, it has an even greater potential in measuring the integrity of the functional analysis as performed by the logic simulation. A brief description of stuck-at-1 and stuck-at-0 fault simulation is given. Fault simulation is contrasted with the typical controllability and observability measures, and the benefits of high fault coverage are examined. A number of standard techniques for improving fault coverage are discussed.<>