{"title":"非对称自级联码p沟道全耗尽SOI晶体管的模拟性能","authors":"M. de Souza, M. Pavanello, D. Flandre","doi":"10.1109/ICCDCS.2012.6188932","DOIUrl":null,"url":null,"abstract":"This work presents an analysis of the analog performance of asymmetric threshold voltage self-cascode fully depleted (FD) p-type SOI transistors. The experimental results showed that this structure is able to improve the devices transconductance and output conductance, resulting in increased intrinsic voltage gain and breakdown voltage in comparison to single transistors and the conventional symmetric self-cascode.","PeriodicalId":125743,"journal":{"name":"2012 8th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Analog performance of asymmetric self-cascode p-channel fully depleted SOI transistors\",\"authors\":\"M. de Souza, M. Pavanello, D. Flandre\",\"doi\":\"10.1109/ICCDCS.2012.6188932\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents an analysis of the analog performance of asymmetric threshold voltage self-cascode fully depleted (FD) p-type SOI transistors. The experimental results showed that this structure is able to improve the devices transconductance and output conductance, resulting in increased intrinsic voltage gain and breakdown voltage in comparison to single transistors and the conventional symmetric self-cascode.\",\"PeriodicalId\":125743,\"journal\":{\"name\":\"2012 8th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS)\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-03-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 8th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCDCS.2012.6188932\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 8th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCDCS.2012.6188932","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analog performance of asymmetric self-cascode p-channel fully depleted SOI transistors
This work presents an analysis of the analog performance of asymmetric threshold voltage self-cascode fully depleted (FD) p-type SOI transistors. The experimental results showed that this structure is able to improve the devices transconductance and output conductance, resulting in increased intrinsic voltage gain and breakdown voltage in comparison to single transistors and the conventional symmetric self-cascode.