{"title":"混响室中电子系统的辐射抗扰度研究","authors":"L. Guibert, P. Millot, X. Ferrières, E. Sicard","doi":"10.1109/EMCCOMPO.2013.6735176","DOIUrl":null,"url":null,"abstract":"In this paper, we are interested in measuring the level of immunity of the radiated mode of an electronic system. The behavior of this system has been studied in a Mode Stirrer Reverberating Chamber (MSRC). Nowadays, many equipment manufacturers use the MSRC as a measurement facility to describe their electronic systems in the field of EMC. In the first part, we present the use of the MSRC for measuring EMC susceptibility. Then we present the electronic system under test (DUT) and the method allows us to characterize the functional electronic behavior. In a second part, we present a novel method that allows on the one hand measurement the level of immunity and on the other hand derivation of a model of the level of immunity of the electronic system studied.","PeriodicalId":302757,"journal":{"name":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"77 10","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Study of radiated immunity of an electronic system in a reverberating chamber\",\"authors\":\"L. Guibert, P. Millot, X. Ferrières, E. Sicard\",\"doi\":\"10.1109/EMCCOMPO.2013.6735176\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we are interested in measuring the level of immunity of the radiated mode of an electronic system. The behavior of this system has been studied in a Mode Stirrer Reverberating Chamber (MSRC). Nowadays, many equipment manufacturers use the MSRC as a measurement facility to describe their electronic systems in the field of EMC. In the first part, we present the use of the MSRC for measuring EMC susceptibility. Then we present the electronic system under test (DUT) and the method allows us to characterize the functional electronic behavior. In a second part, we present a novel method that allows on the one hand measurement the level of immunity and on the other hand derivation of a model of the level of immunity of the electronic system studied.\",\"PeriodicalId\":302757,\"journal\":{\"name\":\"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"volume\":\"77 10\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCCOMPO.2013.6735176\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCOMPO.2013.6735176","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Study of radiated immunity of an electronic system in a reverberating chamber
In this paper, we are interested in measuring the level of immunity of the radiated mode of an electronic system. The behavior of this system has been studied in a Mode Stirrer Reverberating Chamber (MSRC). Nowadays, many equipment manufacturers use the MSRC as a measurement facility to describe their electronic systems in the field of EMC. In the first part, we present the use of the MSRC for measuring EMC susceptibility. Then we present the electronic system under test (DUT) and the method allows us to characterize the functional electronic behavior. In a second part, we present a novel method that allows on the one hand measurement the level of immunity and on the other hand derivation of a model of the level of immunity of the electronic system studied.