基于图的冷电镜密度图主干迹线预测方法

P. Collins, Dong Si
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引用次数: 7

摘要

低温电子显微镜(Cryo-EM)能够获得高分辨率的密度图。这些密度图接近原子分辨率,可以看到单个原子以及大的二级结构元素。然而,如何自动高效地提取主干结构信息是一个难题。本文提出了一种用于高分辨率密度图建立主链轨迹和预测Cα原子位置的新方法。它是一种基于图的方法,利用沿主链的密度和二级结构元素的特征来寻找最佳的主链和Cα原子位置。该方法基本上是自动的,需要初始用户确定阈值和主次结构类型。我们在15张3A分辨率的模拟图和4张2.6-3.1A分辨率的实验低温电镜密度图上测试了我们的方法。结果表明,当密度图在近原子分辨率下不丢失数据时,我们的方法能够生成完整的Cα主链迹。
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A Graph Based Method for the Prediction of Backbone Trace from Cryo-EM Density Maps
Cryo-electron microscopy (Cryo-EM) is able to achieve high resolution density maps. These density maps are near atomic resolution and individual atoms can be seen as well as large secondary structure elements. However, it is challenging to extract the backbone structure information automatically and efficiently. This paper presents a novel method for creating a backbone trace and predicting locations of Cα atoms for high resolution density maps. It is a graph based method utilizing density along a backbone trace and features of secondary structure elements to find the optimal backbone trace and Cα atom locations. The method is mostly automatic requiring an initial user determined threshold value and primary secondary structure type. We tested our method on fifteen simulated maps at 3A resolution and four experimental cryo-EM density maps between 2.6-3.1A resolution. The result shows that our method is able to generate a complete Cα backbone trace when the density map is not missing data at near atomic resolution.
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