2.52太赫兹电控物体反射率测量方案

2012 International Conference on Optoelectronics and Microelectronics Pub Date : 2012-10-02 DOI:10.1109/ICOOM.2012.6316257

Jian-Yu She, Yun-Da Li, Qi Li, Qi Wang

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摘要

为了测量某些物体的弱反射特性，提出了一种基于太赫兹激光器和单元探测器的2.52太赫兹电控物体反射率测量方案。介绍了测量理论。针对人工控制、不同物体厚度、放置位置和异步信号引起的测量误差，提出了相应的解决方案。

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A 2.52 THz electrically controlled object reflectivity measurement plan

To measure the weak reflection characteristics of certain objects, a 2.52 THz electrically controlled object reflectivity measurement plan based on a THz laser and a cell detector has been proposed. The measurement theory was introduced. The solutions of the measurement errors caused by manual control, different object thicknesses, placed position and asynchronous signal have been also presented.

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2012 International Conference on Optoelectronics and Microelectronics

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