基于Am/IDG-FET的可重构电池与lut:特性描述和分析

K. Cheng, S. Le Beux, I. O’Connor
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引用次数: 1

摘要

双极和/或独立双栅极fet (Am/IDG-FET)技术提供了在晶体管级优化可重构单元结构的可能性。许多这样的可重构电池已经被提出提供不同的部分功能集,并且以前的工作显示了这种设计在电气性能方面的好处。考虑到晶体管数量和输入数量,本文分析了基于Am/ idg - fet的可重构单元与常用的2、4和6输入lut的优缺点。结果显示了剧烈的优化(晶体管数量减少30%到50%),但代价是在单元水平上减少了一组功能。由于主要FPGA制造商证明6输入lut是输入粒度方面的最佳解决方案,基于6输入Am/IDG-FET的可重构单元代表了相当优化的解决方案。
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Am/IDG-FET based reconfigurable cells versus LUTs: Characteristics description and analysis
Ambipolar and/or Independent Double Gate-FET (Am/IDG-FET) technology offers the possibility to optimize the architecture of reconfigurable cells at transistor level. Many of such reconfigurable cells have been proposed offering different partial functionality set, and previous work shows the benefit of such designs in terms of electric performance. This paper analyzes the benefits and drawbacks of Reconfigurable Cells based on Am/IDG-FETs versus commonly used 2, 4, and 6-inputs LUTs considering the number of transistor and the number of input. Results show the drastic optimization (Reduction of 30% to 50% of the transistor count) but at the cost of a reduce set of function at the cell level. As main FPGA manufacturer proved that a 6-inputs LUTs is the best solutions in terms of input granularity, 6-inputs Am/IDG-FET based Reconfigurable cells represent a considerable optimized solution.
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