一种w波段低损耗、高功率的反向饱和开关

Peigen Zhou, Haoyi Dong, Zhigang Peng, Jixin Chen, Debin Hou, P. Yan, Yu Xiang, W. Hong
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引用次数: 1

摘要

本文介绍了一种使用$0.13\ {\mu} \mathbf{m}$反向饱和SiGe hbt的单极双掷(SPDT)开关。该开关基于${\lambda}/4$传输线,并通过在NPN晶体管周围增加小面积的衬底触点和在集电极和发射极之间分别增加隔离增强电感来提高插入损耗和隔离性能。在81-98 GHz频段测量到的插入损耗为1.4-1.6 dB,在整个w频段的插入损耗< 2.5 dB。测量的输出端口到端口隔离在78-97 GHz频率为> 25 dB,在w频段频率为> 20dB。在75 ~ 102 GHz频段,回波损耗小于10 dB。据作者所知,所提出的开关在w频段频率下的硅基SPDT开关中具有最低的插入损耗。
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A W-Band Low Loss, High Power SPDT Switch Using Reverse Saturated $0.13\ \mu \mathrm{m}$ SiGe HBTs
This paper presents a sigle-pole double-throw (SPDT) switch using a $0.13\ {\mu} \mathbf{m}$ reverse saturated SiGe HBTs. The switch is based on ${\lambda}/4$ transmission line and the performance of insertion loss and isolation is improved by adding a small area of substrate contacts around the NPN transistors and an isolation-boosting inductance between the collector and emitter, respectively. A measured insertion loss of 1.4-1.6 dB is achieved at 81-98 GHz and < 2.5 dB in the whole W-band frequencies. The measured output port-to-port isolation is > 25 dB at 78-97 GHz and > 20dB in W-band frequencies. The return loss is better than 10 dB at 75-102 GHz. To the best of the authors' knowledge, the proposed switch demonstrates the lowest insertion loss in the silicon-based SPDT switches in W-band frequencies.
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