{"title":"高轴向分辨率的荧光干涉结构照明显微镜三维形态学成像","authors":"Yile Sun, Hongfei Zhu, Lu Yin, Hanmeng Wu, Mingxuan Cai, Weiyun Sun, Yueshu Xu, Xinxun Yang, Jiaxiao Han, Wenjie Liu, Yubing Han, Xiang Hao, Renjie Zhou, Cuifang Kuang, Xu Liu","doi":"10.1117/1.ap.5.5.056007","DOIUrl":null,"url":null,"abstract":"Imaging three-dimensional, subcellular structures with high axial resolution has always been the core purpose of fluorescence microscopy. However, trade-offs exist between axial resolution and other important technical indicators, such as temporal resolution, optical power density, and imaging process complexity. We report a new imaging modality, fluorescence interference structured illumination microscopy (FI-SIM), which is based on three-dimensional structured illumination microscopy for wide-field lateral imaging and fluorescence interference for axial reconstruction. FI-SIM can acquire images quickly within the order of hundreds of milliseconds and exhibit even 30 nm axial resolution in half the wavelength depth range without z-axis scanning. Moreover, the relatively low laser power density relaxes the requirements for dyes and enables a wide range of applications for observing fixed and live subcellular structures.","PeriodicalId":33241,"journal":{"name":"Advanced Photonics","volume":null,"pages":null},"PeriodicalIF":20.6000,"publicationDate":"2023-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fluorescence interference structured illumination microscopy for 3D morphology imaging with high axial resolution\",\"authors\":\"Yile Sun, Hongfei Zhu, Lu Yin, Hanmeng Wu, Mingxuan Cai, Weiyun Sun, Yueshu Xu, Xinxun Yang, Jiaxiao Han, Wenjie Liu, Yubing Han, Xiang Hao, Renjie Zhou, Cuifang Kuang, Xu Liu\",\"doi\":\"10.1117/1.ap.5.5.056007\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Imaging three-dimensional, subcellular structures with high axial resolution has always been the core purpose of fluorescence microscopy. However, trade-offs exist between axial resolution and other important technical indicators, such as temporal resolution, optical power density, and imaging process complexity. We report a new imaging modality, fluorescence interference structured illumination microscopy (FI-SIM), which is based on three-dimensional structured illumination microscopy for wide-field lateral imaging and fluorescence interference for axial reconstruction. FI-SIM can acquire images quickly within the order of hundreds of milliseconds and exhibit even 30 nm axial resolution in half the wavelength depth range without z-axis scanning. Moreover, the relatively low laser power density relaxes the requirements for dyes and enables a wide range of applications for observing fixed and live subcellular structures.\",\"PeriodicalId\":33241,\"journal\":{\"name\":\"Advanced Photonics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":20.6000,\"publicationDate\":\"2023-09-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advanced Photonics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/1.ap.5.5.056007\",\"RegionNum\":1,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Photonics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/1.ap.5.5.056007","RegionNum":1,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
Fluorescence interference structured illumination microscopy for 3D morphology imaging with high axial resolution
Imaging three-dimensional, subcellular structures with high axial resolution has always been the core purpose of fluorescence microscopy. However, trade-offs exist between axial resolution and other important technical indicators, such as temporal resolution, optical power density, and imaging process complexity. We report a new imaging modality, fluorescence interference structured illumination microscopy (FI-SIM), which is based on three-dimensional structured illumination microscopy for wide-field lateral imaging and fluorescence interference for axial reconstruction. FI-SIM can acquire images quickly within the order of hundreds of milliseconds and exhibit even 30 nm axial resolution in half the wavelength depth range without z-axis scanning. Moreover, the relatively low laser power density relaxes the requirements for dyes and enables a wide range of applications for observing fixed and live subcellular structures.
期刊介绍：
Advanced Photonics is a highly selective, open-access, international journal that publishes innovative research in all areas of optics and photonics, including fundamental and applied research. The journal publishes top-quality original papers, letters, and review articles, reflecting significant advances and breakthroughs in theoretical and experimental research and novel applications with considerable potential.
The journal seeks high-quality, high-impact articles across the entire spectrum of optics, photonics, and related fields with specific emphasis on the following acceptance criteria:
-New concepts in terms of fundamental research with great impact and significance
-State-of-the-art technologies in terms of novel methods for important applications
-Reviews of recent major advances and discoveries and state-of-the-art benchmarking.
The journal also publishes news and commentaries highlighting scientific and technological discoveries, breakthroughs, and achievements in optics, photonics, and related fields.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
