基于改进粒子群优化的支持向量机模拟电路故障诊断

IF 0.6 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Nanoelectronics and Optoelectronics Pub Date : 2023-06-01 DOI:10.1166/jno.2023.3417
Junping Yang, Qinghua Song
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引用次数: 0

摘要

电子电路的发展要求电路设备和系统运行的可靠性和安全性也越来越高。此外,由于运行环境的复杂性,在电路系统中加强模拟电路的故障诊断和实时测试技术是非常重要的。在此基础上,研究了基于支持向量机(SVM)的模拟电路故障诊断,并引入改进粒子群算法(IPSO)对支持向量机的参数进行优化。也就是说,粒子群优化(PSO)算法的动态权值设置和因子改进旨在加速算法性能的提高,并在考虑电路故障特征的基础上进行信息提取和诊断模型构建。通过对本文提出的改进算法的性能测试和应用分析,改进算法在分类训练后期的误差值基本稳定在0.0103,预测准确率在80%以上,分类消耗时间更少。同时,在训练和测试场景下,故障特征提取结果的准确率均在94%以上,搜索性能明显优于其他比较算法,有效提高了故障诊断的准确率和效率。IPSO算法模型能有效地识别模拟电路故障信息,并显示出良好的信息优化性能。在电路故障诊断和安全保障方面具有一定的有效性和合理性。
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Fault Diagnosis of Support Vector Machine Analog Circuits Based on Improved Particle Swarm Optimization
The development of electronic circuits requires that the reliability and security of circuit equipment and system operation are also increasing. In addition, due to the complexity of the operating environment, it is very important to strengthen the fault diagnosis and real-time testing technology of analog circuits in circuit systems. Based on this, this paper studied the fault diagnosis of analog circuits with Support Vector Machine (SVM), and introduced Improved Particle Swarm Optimization (IPSO) algorithm to optimize the parameters of SVM. In other words, the dynamic weight setting and factor improvement of Particle Swarm Optimization (PSO) algorithm aim to accelerate algorithm performance improvement, and information extraction and diagnosis model construction are carried out on the basis of considering circuit fault characteristics. Through the performance test and application analysis of the improved algorithm proposed in the study, the error value of the improved algorithm was basically stable at 0.0103 in the late stage of classification training, and its prediction accuracy rate was more than 80%, and the classification consumption time was less. At the same time, the accuracy of fault feature extraction results in training and test scenarios was above 94%, and the search performance was obviously better than other comparison algorithms, which effectively improved the fault diagnosis accuracy and efficiency. The IPSO algorithm model can effectively identify analog circuit fault information, and shows good information optimization performance. It has certain validity and rationality in circuit fault diagnosis and security assurance.
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来源期刊
Journal of Nanoelectronics and Optoelectronics
Journal of Nanoelectronics and Optoelectronics 工程技术-工程:电子与电气
自引率
16.70%
发文量
48
审稿时长
12.5 months
期刊最新文献
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