基于红外光电传感器的热成像检测装置及其在变压器套管绝缘故障检测中的应用

IF 0.6 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Nanoelectronics and Optoelectronics Pub Date : 2023-06-01 DOI:10.1166/jno.2023.3447
Shengcheng Li, Tao Lu, Lei Zhai, Yi Xiao
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引用次数: 0

摘要

由于红外热成像系统与可见光相比具有独特的优势,红外光电传感器可以将感知到的红外光转换成电信号,帮助人们进行观察和分析。热成像探测设备正朝着小型化、低功耗、高分辨率的方向发展。根据这一要求,对红外探测的热成像探测系统进行了硬件设计,采用640×512非制冷红外焦平面阵列。选择ADV7390作为视频编码芯片,对该器件的低功耗特性进行了优化。选择参考源+数字电位器+运算放大器作为模拟偏置方案,可以使输出的模拟偏置在一定的电压范围内。对检测器的信号处理方法进行了改进,即用V REF对电压进行分频,形成差分信号,再送入ADC芯片。在实验中,测试了DC/DC开关电源、LDO输出电压和纹波。结果表明,测量电压值接近标准电压值,信号电压基本在2v左右,且信号电压低于信号范围波动,符合预期。将其用于检测变压器套管绝缘缺陷,并设计了一种红外热成像装置来捕获套管绝缘缺陷。结合特征点匹配法,得到了套管绝缘缺陷的红外特征分布,通过连续跟踪可以得到变压器套管外部的红外光谱,从而确定异常温度位置。
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Thermal Imaging Detection Device Based on Infrared Photoelectric Sensor and Its Application in Fault Detection of Transformer Bushing Insulation
Due to the unique advantages of infrared thermal imaging system compared with visible light, infrared photoelectric sensors can convert the perceived infrared light into electrical signals, which can help people to observe and analyze. Thermal imaging detection devices are developing towards miniaturization, low power consumption and high resolution. According to this requirement, the hardware design of thermal imaging detection system for infrared detection is carried out, and 640×512 uncooled infrared focal plane array is adopted. ADV7390 is selected as the video coding chip, and the low power consumption characteristics of this device are optimized. Selecting reference source+digital potentiometer+operational amplifier as analog bias scheme can make the output analog bias within a certain voltage range. The signal processing method of the detector is improved, that is, divide the voltage and form a differential signal with V REF , and then send it to the ADC chip. In the experiment, DC/DC switching power supply, LDO output voltage and ripple are tested. The results show that the measured voltage value is close to the standard voltage value, the signal voltage is basically around 2 V, and the signal voltage is lower than the signal range fluctuation, which is in line with expectations. It is used to detect transformer bushing insulation defects, and an infrared thermal imaging device is designed to capture bushing insulation defects. Combined with the feature point matching method, the infrared feature distribution of bushing insulation defects is obtained, and the infrared spectrum of the outside of transformer bushing can be obtained through continuous tracking to determine the abnormal temperature position.
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来源期刊
Journal of Nanoelectronics and Optoelectronics
Journal of Nanoelectronics and Optoelectronics 工程技术-工程:电子与电气
自引率
16.70%
发文量
48
审稿时长
12.5 months
期刊最新文献
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