面向RISC-V和非易失性存储器的fpga仿真平台

IF 1.7 4区 计算机科学 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE IEEE Embedded Systems Letters Pub Date : 2023-09-25 DOI:10.1109/LES.2023.3299202
Yuankang Zhao;Salim Ullah;Siva Satyendra Sahoo;Akash Kumar
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引用次数: 0

摘要

新兴的非易失性存储器(nvm),如自旋传递扭矩随机存取存储器(STT-RAM)和赛道存储器(RTM),提供了一个有前途的解决方案,以满足现代应用的内存和性能要求。与常用的易失性静态随机存取存储器(sram)相比,nvm具有更好的容量和能效。然而,许多nvm仍处于开发阶段,需要进行适当的评估,以评估其在系统级使用的影响。因此,有必要设计功能和周期精确的模拟器/仿真器来评估这些存储技术的性能。为此,本研究的重点是实现一个基于risc - v的仿真平台来评估nvm。该框架提供了集成各种类型nvm的接口,以rtm和stt - ram作为测试用例。通过执行基准应用程序来评估框架的有效性。
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NvMISC: Toward an FPGA-Based Emulation Platform for RISC-V and Nonvolatile Memories
The emerging nonvolatile memories (NVMs), such as spin transfer torque random access memory (STT-RAM) and racetrack memory (RTM), offer a promising solution to satisfy the memory and performance requirements of modern applications. Compared to the commonly utilized volatile static random-access memories (SRAMs), the NVMs provide better capacity and energy efficiency. However, many of these NVMs are still in the development phases and require proper evaluation in order to evaluate the impact of their use at the system level. Therefore, there is a need to design functional- and cycleaccurate simulators/emulators to evaluate the performance of these memory technologies. To this end, this work focuses on implementing a RISC-V-based emulation platform for evaluating NVMs. The proposed framework provides interfaces to integrate various types of NVMs, with RTMs and STT-RAMs used as test cases. The efficacy of the framework is evaluated by executing benchmark applications.
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来源期刊
IEEE Embedded Systems Letters
IEEE Embedded Systems Letters Engineering-Control and Systems Engineering
CiteScore
3.30
自引率
0.00%
发文量
65
期刊介绍: The IEEE Embedded Systems Letters (ESL), provides a forum for rapid dissemination of latest technical advances in embedded systems and related areas in embedded software. The emphasis is on models, methods, and tools that ensure secure, correct, efficient and robust design of embedded systems and their applications.
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