{"title":"一种用于低功率SRAM的具有增强偏移容限的电容耦合堆叠感测放大器","authors":"Pengyuan Zhao, Huidong Zhao, Jialu Yin, Zhi Li, Shushan Qiao","doi":"10.1587/elex.20.20230484","DOIUrl":null,"url":null,"abstract":"A capacitor-coupled stacked-based sense amplifier (CC-STSA) is proposed to compensate the input-referred offset voltage (VOS), which dictates the minimum required bitline swing for a reliable read operation of static random access memory (SRAM). The data-aware coupled capacitors are employed to dynamically tune the driving ability of sensing transistors according to the data supposed to be read, thus improving the offset tolerance of sense amplifier (SA). Compared with the conventional current latch-type SA (CLSA), the simulation results in 55-nm CMOS technology show that the proposed scheme achieves more than 4.17X of the standard deviation of VOS (σOS) reduction across the range of supply voltage from 0.6V to 1.2V and reduce the read energy consumption and read delay to 54.9% and 45.5% respectively. Furthermore, the proposed scheme reduces the σOS by 2.19X compared to DIBBSA on average.","PeriodicalId":50387,"journal":{"name":"Ieice Electronics Express","volume":"39 1","pages":"0"},"PeriodicalIF":0.8000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A capacitor-coupled stacked-based sense amplifier with enhanced offset tolerance for low power SRAM\",\"authors\":\"Pengyuan Zhao, Huidong Zhao, Jialu Yin, Zhi Li, Shushan Qiao\",\"doi\":\"10.1587/elex.20.20230484\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A capacitor-coupled stacked-based sense amplifier (CC-STSA) is proposed to compensate the input-referred offset voltage (VOS), which dictates the minimum required bitline swing for a reliable read operation of static random access memory (SRAM). The data-aware coupled capacitors are employed to dynamically tune the driving ability of sensing transistors according to the data supposed to be read, thus improving the offset tolerance of sense amplifier (SA). Compared with the conventional current latch-type SA (CLSA), the simulation results in 55-nm CMOS technology show that the proposed scheme achieves more than 4.17X of the standard deviation of VOS (σOS) reduction across the range of supply voltage from 0.6V to 1.2V and reduce the read energy consumption and read delay to 54.9% and 45.5% respectively. Furthermore, the proposed scheme reduces the σOS by 2.19X compared to DIBBSA on average.\",\"PeriodicalId\":50387,\"journal\":{\"name\":\"Ieice Electronics Express\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.8000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Ieice Electronics Express\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1587/elex.20.20230484\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ieice Electronics Express","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1587/elex.20.20230484","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
A capacitor-coupled stacked-based sense amplifier with enhanced offset tolerance for low power SRAM
A capacitor-coupled stacked-based sense amplifier (CC-STSA) is proposed to compensate the input-referred offset voltage (VOS), which dictates the minimum required bitline swing for a reliable read operation of static random access memory (SRAM). The data-aware coupled capacitors are employed to dynamically tune the driving ability of sensing transistors according to the data supposed to be read, thus improving the offset tolerance of sense amplifier (SA). Compared with the conventional current latch-type SA (CLSA), the simulation results in 55-nm CMOS technology show that the proposed scheme achieves more than 4.17X of the standard deviation of VOS (σOS) reduction across the range of supply voltage from 0.6V to 1.2V and reduce the read energy consumption and read delay to 54.9% and 45.5% respectively. Furthermore, the proposed scheme reduces the σOS by 2.19X compared to DIBBSA on average.
期刊介绍:
An aim of ELEX is rapid publication of original, peer-reviewed short papers that treat the field of modern electronics and electrical engineering. The boundaries of acceptable fields are not strictly delimited and they are flexibly varied to reflect trends of the fields. The scope of ELEX has mainly been focused on device and circuit technologies. Current appropriate topics include:
- Integrated optoelectronics (lasers and optoelectronic devices, silicon photonics, planar lightwave circuits, polymer optical circuits, etc.)
- Optical hardware (fiber optics, microwave photonics, optical interconnects, photonic signal processing, photonic integration and modules, optical sensing, etc.)
- Electromagnetic theory
- Microwave and millimeter-wave devices, circuits, and modules
- THz devices, circuits and modules
- Electron devices, circuits and modules (silicon, compound semiconductor, organic and novel materials)
- Integrated circuits (memory, logic, analog, RF, sensor)
- Power devices and circuits
- Micro- or nano-electromechanical systems
- Circuits and modules for storage
- Superconducting electronics
- Energy harvesting devices, circuits and modules
- Circuits and modules for electronic displays
- Circuits and modules for electronic instrumentation
- Devices, circuits and modules for IoT and biomedical applications