具有可调NMOS栅极偏压的无电阻电源轨ESD钳位电路设计

IF 1.9 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Semiconductor Science and Technology Pub Date : 2023-10-18 DOI:10.1088/1361-6641/ad01d3
Shuang Li, Yang Wang, Hongke Tao, Qing Liu, Zhiwen Zeng, Xiangliang Jin, Hongjiao Yang
{"title":"具有可调NMOS栅极偏压的无电阻电源轨ESD钳位电路设计","authors":"Shuang Li, Yang Wang, Hongke Tao, Qing Liu, Zhiwen Zeng, Xiangliang Jin, Hongjiao Yang","doi":"10.1088/1361-6641/ad01d3","DOIUrl":null,"url":null,"abstract":"Abstract Based on the 0.18 μ m CMOS process, proposed a new power-rail electrostatic discharge clamp circuit. The proposed circuit can adjust the voltage biased to the big clamp NMOS (M big ) gate by adjusting the width of one MOS transistor, and the feedback path is designed to prolong the response time of M big . The simulation results demonstrated that the voltage biased to the M big of the proposed circuit has a relatively steady state and the M big has a longer response time, which can effectively reduce the damage to the gate oxide layer of the M big with large voltage overshoot. The transmission line pulse test results show that compared to the M big of the conventional circuit, the M big of the proposed circuit has higher trigger voltage, lower on-resistance, and better robustness.","PeriodicalId":21585,"journal":{"name":"Semiconductor Science and Technology","volume":"24 1","pages":"0"},"PeriodicalIF":1.9000,"publicationDate":"2023-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Resistor-less power-rail ESD clamp circuit design with adjustable NMOS gate biased voltage\",\"authors\":\"Shuang Li, Yang Wang, Hongke Tao, Qing Liu, Zhiwen Zeng, Xiangliang Jin, Hongjiao Yang\",\"doi\":\"10.1088/1361-6641/ad01d3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract Based on the 0.18 μ m CMOS process, proposed a new power-rail electrostatic discharge clamp circuit. The proposed circuit can adjust the voltage biased to the big clamp NMOS (M big ) gate by adjusting the width of one MOS transistor, and the feedback path is designed to prolong the response time of M big . The simulation results demonstrated that the voltage biased to the M big of the proposed circuit has a relatively steady state and the M big has a longer response time, which can effectively reduce the damage to the gate oxide layer of the M big with large voltage overshoot. The transmission line pulse test results show that compared to the M big of the conventional circuit, the M big of the proposed circuit has higher trigger voltage, lower on-resistance, and better robustness.\",\"PeriodicalId\":21585,\"journal\":{\"name\":\"Semiconductor Science and Technology\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2023-10-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Semiconductor Science and Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/1361-6641/ad01d3\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Semiconductor Science and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/1361-6641/ad01d3","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

摘要基于0.18 μ m CMOS工艺,提出了一种新的电源导轨静电放电箝位电路。该电路通过调节一个MOS晶体管的宽度来调节大钳位NMOS (M big)栅极的偏置电压,并设计了延长M big响应时间的反馈路径。仿真结果表明,该电路偏置于M大的电压具有相对稳定的状态,且M大具有较长的响应时间,可以有效地减少对电压超调较大的M大栅极氧化层的破坏。传输线脉冲测试结果表明,与传统电路的M big相比,该电路的M big具有更高的触发电压、更低的导通电阻和更好的鲁棒性。
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Resistor-less power-rail ESD clamp circuit design with adjustable NMOS gate biased voltage
Abstract Based on the 0.18 μ m CMOS process, proposed a new power-rail electrostatic discharge clamp circuit. The proposed circuit can adjust the voltage biased to the big clamp NMOS (M big ) gate by adjusting the width of one MOS transistor, and the feedback path is designed to prolong the response time of M big . The simulation results demonstrated that the voltage biased to the M big of the proposed circuit has a relatively steady state and the M big has a longer response time, which can effectively reduce the damage to the gate oxide layer of the M big with large voltage overshoot. The transmission line pulse test results show that compared to the M big of the conventional circuit, the M big of the proposed circuit has higher trigger voltage, lower on-resistance, and better robustness.
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来源期刊
Semiconductor Science and Technology
Semiconductor Science and Technology 工程技术-材料科学:综合
CiteScore
4.30
自引率
5.30%
发文量
216
审稿时长
2.4 months
期刊介绍: Devoted to semiconductor research, Semiconductor Science and Technology''s multidisciplinary approach reflects the far-reaching nature of this topic. The scope of the journal covers fundamental and applied experimental and theoretical studies of the properties of non-organic, organic and oxide semiconductors, their interfaces and devices, including: fundamental properties materials and nanostructures devices and applications fabrication and processing new analytical techniques simulation emerging fields: materials and devices for quantum technologies hybrid structures and devices 2D and topological materials metamaterials semiconductors for energy flexible electronics.
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