γ辐照损伤CMOS图像传感器对相机信噪比的影响

IF 0.6 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Nanoelectronics and Optoelectronics Pub Date : 2023-07-01 DOI:10.1166/jno.2023.3459
Jie Feng, Hai-Chuan Wang, Kun-Fang Li, Yu-Dong Li, Lin Wen, Qi Guo
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引用次数: 0

摘要

核电站在强辐射环境下的工业运行,需要安装在核机器人上的摄像头对环境视觉信息进行检测。CMOS图像传感器作为相机的核心部件,在核辐射环境下工作时,会受到γ射线辐射的影响,使光电敏感参数降低,带来视觉噪声,具体表现为相机的信噪比降低。本研究开展了γ射线辐照下CMOS图像传感器和相机系统的实验,分析了γ射线辐照下CMOS图像传感器暗电流和量子效率的退化机理,并分析了它们对相机信噪比的影响机理。建立了定量评价公式,评价了γ射线辐射环境下CMOS图像传感器的暗电流和量子效率对相机信噪比的影响。本研究为强核辐射环境下防辐射摄像机的性能评价提供了理论依据,对今后核工业的发展也有一定的贡献。
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Impact of γ Irradiation Damage to CMOS Image Sensor on Camera Signal-To-Noise Ratio
The industrial operation of nuclear power plant under the strong radiation environment requires the detection of environmental visual information by the camera mounted on the nuclear robot. CMOS Image Sensor, as the core component of camera, will be affected by γ -ray radiation when working in nuclear radiation environment, which will degrade photoelectric sensitive parameters and bring in visual noise, embodied in a decrease of signal-to-noise ratio of the camera. This study carried out the experiments of CMOS Image Sensor and camera system under γ -ray irradiation, analyzed the degradation mechanism of dark current and quantum efficiency of CMOS image sensor under γ -ray radiation, and analysis their impact mechanism on signal-to-noise ratio of the camera. A quantitative evaluation formula was established to evaluate the impact of dark current and quantum efficiency of the CMOS image sensor on signal-to-noise ratio of camera in γ -ray radiation environment. This study provides the theoretical basis for the evaluation of the anti-radiation camera operating under strong nuclear radiation environment and contributes to the future development of nuclear industry.
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来源期刊
Journal of Nanoelectronics and Optoelectronics
Journal of Nanoelectronics and Optoelectronics 工程技术-工程:电子与电气
自引率
16.70%
发文量
48
审稿时长
12.5 months
期刊最新文献
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