Diffraction by a Parallel-Plate Multiport Using the Method of Kobayashi Potentials

Application of Kobayashi potentials (KP) is extended to the electromagnetic (EM) diffraction from the parallel-plate multiport. Standard integral identities are used for problem formulation, without the direct use of Weber-Schafheitlin (WS) integrals. The Fourier function space is exploited for the construction of the governing linear system of equations. A simple strategy is suggested for the evaluation of the required improper integrals. Two-dimensional T- and X-junctions are studied as special cases. Numerical results are validated through convergence test and asymptotic analysis. It is shown that whenever the wave number in the whole problem domain is positive, no real power transfers to the diffracted field in the horizontal section of the aforementioned structures.