Dong Zheng, Christopher N. Young, William F. Stickle
{"title":"Cr Kα激发下Ti和TiO2的硬x射线光电子能谱参考谱","authors":"Dong Zheng, Christopher N. Young, William F. Stickle","doi":"10.1116/6.0002991","DOIUrl":null,"url":null,"abstract":"Hard x-ray photoelectron spectroscopy using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on pure titanium and titanium dioxide samples. Survey data, extended range high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2023-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Hard x-ray photoelectron spectroscopy reference spectra of Ti and TiO2 with Cr Kα excitation\",\"authors\":\"Dong Zheng, Christopher N. Young, William F. Stickle\",\"doi\":\"10.1116/6.0002991\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Hard x-ray photoelectron spectroscopy using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on pure titanium and titanium dioxide samples. Survey data, extended range high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.\",\"PeriodicalId\":22006,\"journal\":{\"name\":\"Surface Science Spectra\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2023-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Surface Science Spectra\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1116/6.0002991\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"PHYSICS, CONDENSED MATTER\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Surface Science Spectra","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1116/6.0002991","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
Hard x-ray photoelectron spectroscopy reference spectra of Ti and TiO2 with Cr Kα excitation
Hard x-ray photoelectron spectroscopy using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on pure titanium and titanium dioxide samples. Survey data, extended range high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
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