Shin-ichi Kimura, Hiroshi Watanabe, Shingo Tatsukawa, Takuto Nakamura, Keiichiro Imura, Hiroyuki S. Suzuki, Noriaki K. Sato
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引用次数: 0
摘要
单硫化钐(SmS)是一种强相关绝缘体,它不仅具有从黑色变为金黄色的压力诱导绝缘体向金属转变(IMT)现象,而且还具有负电阻的电流诱导绝缘体向金属转变(CIMT)现象。为了弄清 SmS 的 CIMT 的起源,我们通过施加电流的光学反射率和角度积分光电子能谱研究了电子结构的变化。在低于约 100 K 的温度下,即观察到非线性 V-I 曲线的温度下,载流子密度迅速增加,同时载流子的弛豫时间随着电流的增加而减少。然后,直接间隙增大,平均价态随着电流的增加从 Sm2+ 主导型 SmS 转变为混合价态。这些结果表明,CIMT 源于外加电流引起的 Sm 4f-5d 杂化强度的增加。
Current-Induced Metallization and Valence Transition in Black SmS
A strongly correlated insulator, samarium mono-sulfide (SmS), presents not only the pressure-induced insulator-to-metal transition (IMT) with the color change from black to golden-yellow but also current-induced IMT (CIMT) with negative resistance. To clarify the origin of the CIMT of SmS, the electronic structure change has been investigated by optical reflectivity and angle-integrated photoelectron spectra by applying an electric current. At lower temperatures than about 100 K, where the nonlinear V–I curve has been observed, the carrier density rapidly increases, accompanied by decreasing relaxation time of carriers with increasing current. Then, the direct gap size increases, and the mean valence changes from Sm2+-dominant SmS to the mixed-valent one with increasing current. These results suggest that the CIMT originates from increasing the Sm 4f-5d hybridization intensity induced by the applied current.
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