使用 Extra Tree 分类算法和特征选择策略对制造过程进行智能故障诊断

IF 5.2 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Open Journal of the Industrial Electronics Society Pub Date : 2023-11-20 DOI:10.1109/OJIES.2023.3334429
Sina Yousefi;Shen Yin;Muhammad Gibran Alfarizi
{"title":"使用 Extra Tree 分类算法和特征选择策略对制造过程进行智能故障诊断","authors":"Sina Yousefi;Shen Yin;Muhammad Gibran Alfarizi","doi":"10.1109/OJIES.2023.3334429","DOIUrl":null,"url":null,"abstract":"Fault diagnosis is integral to maintenance practices, ensuring optimal machinery functionality. While traditional methods relied on human expertise, intelligent fault diagnosis techniques, propelled by machine learning (ML) advancements, now offer automated fault identification. Despite their efficiency, a research gap exists, emphasizing the need for methods providing not just reliable fault identification but also in-depth causal factor analysis. This research introduces a novel approach using an extra tree classification algorithm and feature selection to identify fault importance in manufacturing processes. Compared with SVM, neural networks, and tree-based ML, the method enhances training and computational efficiency, achieving over 99% classification accuracy on prognostics and health management 2021 dataset. Importantly, the algorithm enables researchers to analyze individual fault causes, addressing a critical research gap. The study provides guidelines for further research, aiming to refine the proposed strategy. This work contributes to advancing fault diagnosis methodologies, combining automation with comprehensive causal analysis, crucial for both academic and industrial applications.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"4 ","pages":"618-628"},"PeriodicalIF":5.2000,"publicationDate":"2023-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10323174","citationCount":"0","resultStr":"{\"title\":\"Intelligent Fault Diagnosis of Manufacturing Processes Using Extra Tree Classification Algorithm and Feature Selection Strategies\",\"authors\":\"Sina Yousefi;Shen Yin;Muhammad Gibran Alfarizi\",\"doi\":\"10.1109/OJIES.2023.3334429\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fault diagnosis is integral to maintenance practices, ensuring optimal machinery functionality. While traditional methods relied on human expertise, intelligent fault diagnosis techniques, propelled by machine learning (ML) advancements, now offer automated fault identification. Despite their efficiency, a research gap exists, emphasizing the need for methods providing not just reliable fault identification but also in-depth causal factor analysis. This research introduces a novel approach using an extra tree classification algorithm and feature selection to identify fault importance in manufacturing processes. Compared with SVM, neural networks, and tree-based ML, the method enhances training and computational efficiency, achieving over 99% classification accuracy on prognostics and health management 2021 dataset. Importantly, the algorithm enables researchers to analyze individual fault causes, addressing a critical research gap. The study provides guidelines for further research, aiming to refine the proposed strategy. This work contributes to advancing fault diagnosis methodologies, combining automation with comprehensive causal analysis, crucial for both academic and industrial applications.\",\"PeriodicalId\":52675,\"journal\":{\"name\":\"IEEE Open Journal of the Industrial Electronics Society\",\"volume\":\"4 \",\"pages\":\"618-628\"},\"PeriodicalIF\":5.2000,\"publicationDate\":\"2023-11-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10323174\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Open Journal of the Industrial Electronics Society\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10323174/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Open Journal of the Industrial Electronics Society","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10323174/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

故障诊断是维护实践中不可或缺的一环,可确保最佳的机械功能。传统方法依赖于人类的专业知识,而在机器学习(ML)技术进步的推动下,智能故障诊断技术现在可以自动识别故障。尽管其效率很高,但仍存在研究空白,强调不仅需要可靠的故障识别方法,还需要深入的因果分析方法。本研究介绍了一种使用额外树分类算法和特征选择来识别制造流程中故障重要性的新方法。与 SVM、神经网络和基于树的 ML 相比,该方法提高了训练和计算效率,在预报和健康管理 2021 数据集上实现了超过 99% 的分类准确率。重要的是,该算法使研究人员能够分析单个故障原因,填补了一项关键的研究空白。本研究为进一步研究提供了指导,旨在完善所提出的策略。这项工作有助于推进故障诊断方法,将自动化与全面的因果分析相结合,这对学术和工业应用都至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Intelligent Fault Diagnosis of Manufacturing Processes Using Extra Tree Classification Algorithm and Feature Selection Strategies
Fault diagnosis is integral to maintenance practices, ensuring optimal machinery functionality. While traditional methods relied on human expertise, intelligent fault diagnosis techniques, propelled by machine learning (ML) advancements, now offer automated fault identification. Despite their efficiency, a research gap exists, emphasizing the need for methods providing not just reliable fault identification but also in-depth causal factor analysis. This research introduces a novel approach using an extra tree classification algorithm and feature selection to identify fault importance in manufacturing processes. Compared with SVM, neural networks, and tree-based ML, the method enhances training and computational efficiency, achieving over 99% classification accuracy on prognostics and health management 2021 dataset. Importantly, the algorithm enables researchers to analyze individual fault causes, addressing a critical research gap. The study provides guidelines for further research, aiming to refine the proposed strategy. This work contributes to advancing fault diagnosis methodologies, combining automation with comprehensive causal analysis, crucial for both academic and industrial applications.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
IEEE Open Journal of the Industrial Electronics Society
IEEE Open Journal of the Industrial Electronics Society ENGINEERING, ELECTRICAL & ELECTRONIC-
CiteScore
10.80
自引率
2.40%
发文量
33
审稿时长
12 weeks
期刊介绍: The IEEE Open Journal of the Industrial Electronics Society is dedicated to advancing information-intensive, knowledge-based automation, and digitalization, aiming to enhance various industrial and infrastructural ecosystems including energy, mobility, health, and home/building infrastructure. Encompassing a range of techniques leveraging data and information acquisition, analysis, manipulation, and distribution, the journal strives to achieve greater flexibility, efficiency, effectiveness, reliability, and security within digitalized and networked environments. Our scope provides a platform for discourse and dissemination of the latest developments in numerous research and innovation areas. These include electrical components and systems, smart grids, industrial cyber-physical systems, motion control, robotics and mechatronics, sensors and actuators, factory and building communication and automation, industrial digitalization, flexible and reconfigurable manufacturing, assistant systems, industrial applications of artificial intelligence and data science, as well as the implementation of machine learning, artificial neural networks, and fuzzy logic. Additionally, we explore human factors in digitalized and networked ecosystems. Join us in exploring and shaping the future of industrial electronics and digitalization.
期刊最新文献
Short-Term Control of Heat Pumps to Support Power Grid Operation Effects of Grid Voltage and Load Unbalances on the Efficiency of a Hybrid Distribution Transformer Enhanced PI Control Based SHC-PWM Strategy for Active Power Filters A Detailed Study on Algorithms for Predictive Maintenance in Smart Manufacturing: Chip Form Classification Using Edge Machine Learning Design and Evaluation of a Voice-Controlled Elevator System to Improve the Safety and Accessibility
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1