Unidimensional versus multidimensional: A bifactor factor structure of the Self-Stigma Scale-Short (SSS-S) among U.S. adults with psychiatric disabilities.

Objective: This study aimed to examine the psychometric properties of the English version of the Self-Stigma Scale-Short (SSS-S), a nine-item self-report self-stigma measurement, among U.S. adults with psychiatric disabilities.

Method: We obtained reliability and validity evidence from a sample of 275 adults with psychiatric disabilities.

Results: Exploratory factor analysis (EFA; n = 139) yielded a two-factor solution that accounts for 64.97% of the variance. Confirmatory factor analysis (CFA; n = 136) was conducted to compare alternative solutions, including a single-factor model, a two-correlated-factor model, a three-correlated-factor model, and a bifactorial model. The CFA results supported the bifactor S·I - 1 model as a superior latent factor structure for the SSS-S. The coefficient ω of the SSS-S was .94, indicating excellent internal reliability. Concurrent validity of the SSS-S was supported by significant positive correlations with societal stigma and psychiatric symptom severity, and negative correlations with psychiatric disability acceptance, general self-efficacy, and hope.

Conclusions and implications for practice: The overall findings concluded that the English version of the SSS-S demonstrated reliable and valid scores and a primarily unidimensional structure of self-stigma among U.S. adults with psychiatric disabilities. Given the adverse impact of self-stigma and its relationships with recovery-related constructs shown in this study, the routine use of the SSS-S is recommended in psychiatric rehabilitation settings. (PsycInfo Database Record (c) 2024 APA, all rights reserved).