基于(SrO、ZrO2)掺杂硅酸铅玻璃的微通道板的寿命特性

Hua Cai, Shangtong Li, Hui Liu, Yifei Wang, Jing Ma, Tiezhu Bo, Jinsheng Jia, Chang Liu
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摘要

微通道板(MCP)是一种先进的带电粒子倍增器,由阵列式微通道玻璃基材料组成,广泛应用于夜视增强、飞行时间质谱仪和电子显微镜等领域。对于高能离子的检测,离子轰击阻力不足成为微通道板的主要瓶颈。包层玻璃是微通道的内壁,决定了微通道板的基础。本文探讨了掺杂(SrO、ZrO2)硅酸铅包层玻璃的微通道板的抗离子轰击性能。应用铯离子枪、激光共聚焦显微镜和真空光电子成像测试设备(VPIT)分别对铅硅酸盐玻璃微通道板的离子刻蚀、表面形貌和寿命进行了研究。测试结果如下:掺杂(SrO、ZrO2)的硅酸铅玻璃和传统硅酸铅玻璃微通道板的累积输出电荷分别≥19.25 C 和 3.21 C。这表明掺杂(SrO,ZrO2)的硅酸铅玻璃肯定会延长 MCP 的工作寿命。
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Lifetime properties of microchannel plate based on the (SrO, ZrO2) doped lead-silicate glass
Microchannel plate (MCP) is an advanced charged particle multiplier consisted of an arrayed microchannels glass-based material, widely used in the fields of night vision intensification, time of flight mass spectrometer, and electron microscopy. For the detection of high-energy ions, inadequate resistance of ion bombardment became the main bottleneck of microchannel plate. The cladding glass was the inner-wall of microchannels and determined the foundation of the microchannel plate. In this paper, the microchannel plate with (SrO, ZrO2) doped lead-silicate cladding glass was explored in the ion bombardment-resistant properties. Cesium ion gun, laser confocal microscope, and Vacuum Photoelectron Imaging Test Facility (VPIT) were applied to investigate the ion etching, surface morphology and the lifetime of the lead-silicate glass microchannel plate, respectively. The test results are as follows: the accumulative output charge of microchannel plate with the (SrO, ZrO2) doped lead-silicate glass and the traditional lead-silicate glass was ≥19.25 C and 3.21 C, respectively. It impacted that (SrO, ZrO2) doped lead-silicate glass certainly benefited the working life of the MCP.
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