{"title":"具有低开关损耗和反向恢复损耗的新型 650 V 无回扣 PMOS-RC-SJBT","authors":"Yuanzhen Yang, Luping Li, Zehong Li, Qianshen Rao, Peng Chen, Min Ren","doi":"10.1088/1361-6641/ad112f","DOIUrl":null,"url":null,"abstract":"A novel 650 V Snapback-free Reverse-conducting Super-junction (SJ) insulated gate bipolar transistor (RC-SJBT) with low switching and reverse recovery loss is proposed and investigated in paper. In where, SJ pillar acts as the drift region, meanwhile PMOS and Schottky are combined on the cathode side. Under the action of SJ pillar, the snapback is effectively suppressed and <inline-formula>\n<tex-math><?CDATA $V_{\\mathrm{on}}$?></tex-math>\n<mml:math overflow=\"scroll\"><mml:msub><mml:mi>V</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\"normal\">o</mml:mi><mml:mi mathvariant=\"normal\">n</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\n<inline-graphic xlink:href=\"sstad112fieqn1.gif\" xlink:type=\"simple\"></inline-graphic>\n</inline-formula>−<inline-formula>\n<tex-math><?CDATA $E_{\\mathrm{off}}$?></tex-math>\n<mml:math overflow=\"scroll\"><mml:msub><mml:mi>E</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\"normal\">o</mml:mi><mml:mi mathvariant=\"normal\">f</mml:mi><mml:mi mathvariant=\"normal\">f</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\n<inline-graphic xlink:href=\"sstad112fieqn2.gif\" xlink:type=\"simple\"></inline-graphic>\n</inline-formula> trade-off of IGBT is also improved. The PMOS and Schottky combined structure enhances on-state carriers of IGBT meanwhile reduces hole injection efficiency during reverse recovery of freewheel diode, thus the reverse recovery switching loss (<inline-formula>\n<tex-math><?CDATA $E_{\\mathrm{rec}}$?></tex-math>\n<mml:math overflow=\"scroll\"><mml:msub><mml:mi>E</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\"normal\">r</mml:mi><mml:mi mathvariant=\"normal\">e</mml:mi><mml:mi mathvariant=\"normal\">c</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\n<inline-graphic xlink:href=\"sstad112fieqn3.gif\" xlink:type=\"simple\"></inline-graphic>\n</inline-formula>) of PMOS-RC-SJBT is reduced without sacrificing IGBT’s performance. Investigated by the TCAD tools, the total switching loss of PMOS-RC-SJBT is reduced by 51.2% from Con. RC-IGBT and 40.6% than the latest commercial RC-IGBT IKWH30N65WR6 of Infineon. Besides that, <inline-formula>\n<tex-math><?CDATA $t_{\\mathrm{sc}}$?></tex-math>\n<mml:math overflow=\"scroll\"><mml:msub><mml:mi>t</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\"normal\">s</mml:mi><mml:mi mathvariant=\"normal\">c</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\n<inline-graphic xlink:href=\"sstad112fieqn4.gif\" xlink:type=\"simple\"></inline-graphic>\n</inline-formula> is increased by 35.3% than RC-SJBT. Additionally, the snapback-free P-collector width is reduced from 340 <italic toggle=\"yes\">µ</italic>m of Con.RC-IGBT to 40 <italic toggle=\"yes\">µ</italic>m of PMOS-RC-SJBT, where the current uniformity is substantially improved.","PeriodicalId":1,"journal":{"name":"Accounts of Chemical Research","volume":null,"pages":null},"PeriodicalIF":16.4000,"publicationDate":"2023-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A novel 650 V snapback-free PMOS-RC-SJBT with low switching and reverse recovery losses\",\"authors\":\"Yuanzhen Yang, Luping Li, Zehong Li, Qianshen Rao, Peng Chen, Min Ren\",\"doi\":\"10.1088/1361-6641/ad112f\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel 650 V Snapback-free Reverse-conducting Super-junction (SJ) insulated gate bipolar transistor (RC-SJBT) with low switching and reverse recovery loss is proposed and investigated in paper. In where, SJ pillar acts as the drift region, meanwhile PMOS and Schottky are combined on the cathode side. Under the action of SJ pillar, the snapback is effectively suppressed and <inline-formula>\\n<tex-math><?CDATA $V_{\\\\mathrm{on}}$?></tex-math>\\n<mml:math overflow=\\\"scroll\\\"><mml:msub><mml:mi>V</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\\\"normal\\\">o</mml:mi><mml:mi mathvariant=\\\"normal\\\">n</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\\n<inline-graphic xlink:href=\\\"sstad112fieqn1.gif\\\" xlink:type=\\\"simple\\\"></inline-graphic>\\n</inline-formula>−<inline-formula>\\n<tex-math><?CDATA $E_{\\\\mathrm{off}}$?></tex-math>\\n<mml:math overflow=\\\"scroll\\\"><mml:msub><mml:mi>E</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\\\"normal\\\">o</mml:mi><mml:mi mathvariant=\\\"normal\\\">f</mml:mi><mml:mi mathvariant=\\\"normal\\\">f</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\\n<inline-graphic xlink:href=\\\"sstad112fieqn2.gif\\\" xlink:type=\\\"simple\\\"></inline-graphic>\\n</inline-formula> trade-off of IGBT is also improved. The PMOS and Schottky combined structure enhances on-state carriers of IGBT meanwhile reduces hole injection efficiency during reverse recovery of freewheel diode, thus the reverse recovery switching loss (<inline-formula>\\n<tex-math><?CDATA $E_{\\\\mathrm{rec}}$?></tex-math>\\n<mml:math overflow=\\\"scroll\\\"><mml:msub><mml:mi>E</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\\\"normal\\\">r</mml:mi><mml:mi mathvariant=\\\"normal\\\">e</mml:mi><mml:mi mathvariant=\\\"normal\\\">c</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\\n<inline-graphic xlink:href=\\\"sstad112fieqn3.gif\\\" xlink:type=\\\"simple\\\"></inline-graphic>\\n</inline-formula>) of PMOS-RC-SJBT is reduced without sacrificing IGBT’s performance. Investigated by the TCAD tools, the total switching loss of PMOS-RC-SJBT is reduced by 51.2% from Con. RC-IGBT and 40.6% than the latest commercial RC-IGBT IKWH30N65WR6 of Infineon. Besides that, <inline-formula>\\n<tex-math><?CDATA $t_{\\\\mathrm{sc}}$?></tex-math>\\n<mml:math overflow=\\\"scroll\\\"><mml:msub><mml:mi>t</mml:mi><mml:mrow><mml:mrow><mml:mi mathvariant=\\\"normal\\\">s</mml:mi><mml:mi mathvariant=\\\"normal\\\">c</mml:mi></mml:mrow></mml:mrow></mml:msub></mml:math>\\n<inline-graphic xlink:href=\\\"sstad112fieqn4.gif\\\" xlink:type=\\\"simple\\\"></inline-graphic>\\n</inline-formula> is increased by 35.3% than RC-SJBT. Additionally, the snapback-free P-collector width is reduced from 340 <italic toggle=\\\"yes\\\">µ</italic>m of Con.RC-IGBT to 40 <italic toggle=\\\"yes\\\">µ</italic>m of PMOS-RC-SJBT, where the current uniformity is substantially improved.\",\"PeriodicalId\":1,\"journal\":{\"name\":\"Accounts of Chemical Research\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":16.4000,\"publicationDate\":\"2023-12-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Accounts of Chemical Research\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1088/1361-6641/ad112f\",\"RegionNum\":1,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"CHEMISTRY, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Accounts of Chemical Research","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1088/1361-6641/ad112f","RegionNum":1,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
A novel 650 V snapback-free PMOS-RC-SJBT with low switching and reverse recovery losses
A novel 650 V Snapback-free Reverse-conducting Super-junction (SJ) insulated gate bipolar transistor (RC-SJBT) with low switching and reverse recovery loss is proposed and investigated in paper. In where, SJ pillar acts as the drift region, meanwhile PMOS and Schottky are combined on the cathode side. Under the action of SJ pillar, the snapback is effectively suppressed and Von−Eoff trade-off of IGBT is also improved. The PMOS and Schottky combined structure enhances on-state carriers of IGBT meanwhile reduces hole injection efficiency during reverse recovery of freewheel diode, thus the reverse recovery switching loss (Erec) of PMOS-RC-SJBT is reduced without sacrificing IGBT’s performance. Investigated by the TCAD tools, the total switching loss of PMOS-RC-SJBT is reduced by 51.2% from Con. RC-IGBT and 40.6% than the latest commercial RC-IGBT IKWH30N65WR6 of Infineon. Besides that, tsc is increased by 35.3% than RC-SJBT. Additionally, the snapback-free P-collector width is reduced from 340 µm of Con.RC-IGBT to 40 µm of PMOS-RC-SJBT, where the current uniformity is substantially improved.
期刊介绍:
Accounts of Chemical Research presents short, concise and critical articles offering easy-to-read overviews of basic research and applications in all areas of chemistry and biochemistry. These short reviews focus on research from the author’s own laboratory and are designed to teach the reader about a research project. In addition, Accounts of Chemical Research publishes commentaries that give an informed opinion on a current research problem. Special Issues online are devoted to a single topic of unusual activity and significance.
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