现场操控薄膜红外光谱中的频带特性

IF 3.7 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY Advanced Photonics Research Pub Date : 2024-01-06 DOI:10.1002/adpr.202470002
Karsten Hinrichs, Naveen Shetty, Sergey Kubatkin, Per Malmberg, Samuel Lara-Avila, Andreas Furchner, Jörg Rappich
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引用次数: 0

摘要

Karsten Hinrichs 及其合作者对薄膜红外光谱中的波段进行了现场操作研究(见文章编号 2300212)。这项研究表明,要详细了解带特性及其与材料介电函数、测量几何形状、薄膜厚度、结构和形态以及探测电磁场极化的关系,就必须进行光学分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Field Manipulation of Band Properties in Infrared Spectra of Thin Films

Field manipulations of bands in the infrared spectra of thin films are studied by Karsten Hinrichs and co-workers (see article number 2300212). This work demonstrates the necessity of optical analyses for gaining a detailed understanding of band properties and their relation to the materials dielectric functions, the measurement geometry, the thickness, structure and morphology of the film as well as the polarization of the probing electromagnetic fields.

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