{"title":"通过组织计量测量网络确保可追溯性","authors":"O. Samoilenko, S. Tsiporenko","doi":"10.21014/actaimeko.v12i4.1586","DOIUrl":null,"url":null,"abstract":"A new scheme for the traceability ensuring, called the Metrological Measurements Network, was proposed. It is not an alternative to the existing scheme but is only another form of implementation of the traceability scheme. It is about the main principle of construction of the Metrological Measurements Network and its advantages over the existing scheme. The main reason is that each laboratory calibrates its own object for measurement using its measurement standard and sends it for calibration to a laboratory-participant and, almost simultaneously, receives a similar object from another laboratory-participant that calibrated it. If each participant, at the same time as the others, makes at least four such calibrations and transfers between laboratories-participants, it will form a common and very precise Metrological Measurement Network in a very short time. It can cover hundreds and even thousands of laboratories in a short period of time. The joint processing of a large number of such measurements will help to define the additive and/or multiplicative biases of each measurement standards. Moreover, the reference conditions are imposed that the sum of additive and, separately, the sum of multiplicative biases for all measurement standards is equal to zero regardless of the number of network participants.","PeriodicalId":37987,"journal":{"name":"Acta IMEKO","volume":"3 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-11-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Traceability ensuring by organizing the Metrological Measurements Network\",\"authors\":\"O. Samoilenko, S. Tsiporenko\",\"doi\":\"10.21014/actaimeko.v12i4.1586\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new scheme for the traceability ensuring, called the Metrological Measurements Network, was proposed. It is not an alternative to the existing scheme but is only another form of implementation of the traceability scheme. It is about the main principle of construction of the Metrological Measurements Network and its advantages over the existing scheme. The main reason is that each laboratory calibrates its own object for measurement using its measurement standard and sends it for calibration to a laboratory-participant and, almost simultaneously, receives a similar object from another laboratory-participant that calibrated it. If each participant, at the same time as the others, makes at least four such calibrations and transfers between laboratories-participants, it will form a common and very precise Metrological Measurement Network in a very short time. It can cover hundreds and even thousands of laboratories in a short period of time. The joint processing of a large number of such measurements will help to define the additive and/or multiplicative biases of each measurement standards. Moreover, the reference conditions are imposed that the sum of additive and, separately, the sum of multiplicative biases for all measurement standards is equal to zero regardless of the number of network participants.\",\"PeriodicalId\":37987,\"journal\":{\"name\":\"Acta IMEKO\",\"volume\":\"3 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-11-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Acta IMEKO\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.21014/actaimeko.v12i4.1586\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Acta IMEKO","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21014/actaimeko.v12i4.1586","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Engineering","Score":null,"Total":0}
Traceability ensuring by organizing the Metrological Measurements Network
A new scheme for the traceability ensuring, called the Metrological Measurements Network, was proposed. It is not an alternative to the existing scheme but is only another form of implementation of the traceability scheme. It is about the main principle of construction of the Metrological Measurements Network and its advantages over the existing scheme. The main reason is that each laboratory calibrates its own object for measurement using its measurement standard and sends it for calibration to a laboratory-participant and, almost simultaneously, receives a similar object from another laboratory-participant that calibrated it. If each participant, at the same time as the others, makes at least four such calibrations and transfers between laboratories-participants, it will form a common and very precise Metrological Measurement Network in a very short time. It can cover hundreds and even thousands of laboratories in a short period of time. The joint processing of a large number of such measurements will help to define the additive and/or multiplicative biases of each measurement standards. Moreover, the reference conditions are imposed that the sum of additive and, separately, the sum of multiplicative biases for all measurement standards is equal to zero regardless of the number of network participants.
期刊介绍:
The main goal of this journal is the enhancement of academic activities of IMEKO and a wider dissemination of scientific output from IMEKO TC events. High-quality papers presented at IMEKO conferences, workshops or congresses are seleted by the event organizers and the authors are invited to publish an enhanced version of their paper in this journal. The journal also publishes scientific articles on measurement and instrumentation not related to an IMEKO event.