位置和屏蔽对低水平伽马射线频谱仪伽马辐射背景的影响

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION MAPAN Pub Date : 2024-01-10 DOI:10.1007/s12647-023-00705-2
Pradyumna Lenka, A. C. Patra, V. K. Thakur, Nitya Soni, S. K. Jha, M. S. Kulkarni
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引用次数: 0

摘要

摘要 在对不同样品基质进行低水平伽马能谱测量时,自然和人为来源的环境伽马辐射水平起着重要作用。高分辨率伽马能谱系统的最低检测水平(MDL)直接取决于本底辐射水平。本研究讨论了本底辐射水平因伽马能谱测量系统所在实验室的位置 (地面或地下)而产生的变化,以及不同屏蔽类型的影响。把伽馬譜法系統遷移到㆞面以㆘的實驗室後,宇宙輻射所引致的本底 輻射水平顯著㆘降。主要伽馬放射體的計數率相應㆞減少了 36%至 59%不等。因此,相应峰值的 MDL 提高了 20% 至 36%。伽馬譜法系統的被動屏蔽由鉛磚改良為鍍銅及鍍錫的圓形鉛環, 盡量減少伽馬射線穿過鉛磚造成的伽馬本底,並減低整體本底。把實驗室設於㆞㆘和採用分級鉛屏蔽的結合效果,使伽 馬譜法系統主要伽馬峰的 MDL 降低了 54%至 80%。
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Effect of Location and Shielding on Gamma Radiation Background in Low Level Gamma Ray Spectrometry

Ambient gamma radiation levels due to natural and anthropogenic sources play an important role in low level gamma spectrometric measurements of different sample matrices. Minimum detection level (MDL) of a high-resolution gamma spectrometry system directly depends on the background radiation levels. The variation of background radiation level due to the location (surface level or below ground level) of the laboratory housing the gamma spectrometric system and the impact of different shielding types is discussed in this study. Relocation of the system to a below ground level laboratory significantly brought down the background induced due to cosmic components. Corresponding reduction in count rates for major gamma emitters ranged from 36 to 59%. Consequently, the MDLs for corresponding peaks improved by 20 to 36%. Improvising the lead bricks-based passive shielding for the gamma spectrometry system to circular lead ring with graded Cu+Sn lining minimised the gamma background due to streaming of gamma rays through lead bricks and reduced the overall background. The combined effect of the location of laboratory below ground level and graded lead shielding resulted in reduction of MDL of the gamma spectrometry system for major gamma peaks by 54 to 80%.

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来源期刊
MAPAN
MAPAN 工程技术-物理:应用
CiteScore
2.30
自引率
20.00%
发文量
91
审稿时长
3 months
期刊介绍: MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology. The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.
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