先进的辐射计量技术及相关应用

IF 1.3 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION MAPAN Pub Date : 2024-01-10 DOI:10.1007/s12647-023-00729-8
D. K. Aswal, S. K. Jha, A. C. Patra
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Advance Radiation Metrology Techniques and Related Applications
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来源期刊
MAPAN
MAPAN 工程技术-物理:应用
CiteScore
2.30
自引率
20.00%
发文量
91
审稿时长
3 months
期刊介绍: MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology. The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.
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