双插入/删除/替换校正码

Yuhang Pi, Zhifang Zhang
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引用次数: 0

摘要

近年来,DNA存储系统的出现使人们开始广泛关注纠正插入、缺失和经典替换的编码研究。在最初的研究中,莱文什泰因发现 VT 编码恰好能够纠正单次插入/删除,并将 VT 结构扩展到单次插入/删除/替换(1 美元-ins/del/sub)纠正编码。受此启发,我们将最近发现的冗余度为$6\log_{2}n+O(1)$的$1$-del$1$-sub纠错码推广到了不增加冗余度的更一般的$2$-ins/del/sub纠错码。我们的关键技术是将高阶 VT 综合法应用于不同的对象,并完成对所有错误模式的系统分类。
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Two-Insertion/Deletion/Substitution Correcting Codes
In recent years, the emergence of DNA storage systems has led to a widespread focus on the research of codes correcting insertions, deletions, and classic substitutions. During the initial investigation, Levenshtein discovered the VT codes are precisely capable of correcting single insertion/deletion and then extended the VT construction to single-insertion/deletion/substitution ($1$-ins/del/sub) correcting codes. Inspired by this, we generalize the recent findings of $1$-del $1$-sub correcting codes with redundancy $6\log_{2}n+O(1)$ to more general $2$-ins/del/sub correcting codes without increasing the redundancy. Our key technique is to apply higher-order VT syndromes to distinct objects and accomplish a systematic classification of all error patterns.
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