内部合成的聚(醚醚酮)离子烯。II.负离子模式下的 ToF-SIMS 图谱

L. Strange, Sudhir Ravula, Zihua Zhu, J. Bara, Ping Chen, D. Heldebrant, Jennifer Yao
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引用次数: 1

摘要

飞行时间二次离子质谱法(ToF-SIMS)用于分析聚醚醚酮(PEEK)膜。PEEK 膜已被证明可有效分离烟气中的二氧化碳(燃烧后技术)。PEEK 膜的合成采用了新型芳香族醚酮连接,其灵感来自 PEEK 与聚合物骨架双三氟利昂 [Tf2N]- 反离子。推进这项技术的关键之一是开发出对二氧化碳具有选择性和渗透性的膜,而基于 PEEK 的膜已被证明具有这种选择性和渗透性。此外,还需要研究各种贫水溶剂之间的兼容性。X 射线光电子能谱和 ToF-SIMS 等表面分析技术有助于研究膜之间的化学变化。在此,我们展示了在负离子模式下获得的四种不同 PEEK 膜的 ToF-SIMS 数据,这些膜设计用于二氧化碳捕获系统。正离子模式光谱见论文 I。
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In-house synthesized poly(ether ether ketone) ionenes. II. ToF-SIMS spectra in the negative ion mode
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to analyze poly(ether ether ketone) (PEEK) based membranes. PEEK membranes have been shown to be effective in the separation of CO2 from flue gases (post-combustion technique). The PEEK membranes were synthesized using novel aromatic ether-ketone linkages inspired by PEEK with polymeric backbone bistriflimide [Tf2N]− counterions. One of the keys to advancing this technology is developing membranes that are selective and permeable toward CO2, in which PEEK based membranes have been shown to be. Furthermore, the compatibility between various water lean solvents also needs to be investigated. Surface analytical techniques such as x-ray photoelectron spectroscopy and ToF-SIMS are useful for investigating chemical changes between membranes. Herein, we present ToF-SIMS data obtained in the negative ion mode for four different PEEK membranes designed for use in CO2 capture systems. Positive ion mode spectra are reported in Paper I.
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