The optical functions of uniaxial rutile and anatase (TiO2) were determined from 200 to 850 nm (6.2 to 1.46 eV) using several of four optical techniques: (1) standard spectroscopic two-modulator generalized ellipsometry (2-MGE), (2) near-normal-incidence two-modulator generalized ellipsometry microscopy (2-MGEM), (3) Mueller matrix transmission of rutile, and (4) polarized transmission of rutile. The 2-MGE measurements yielded highly accurate values of the dielectric functions and error estimates from 1.46 to 6.2 eV, whereas the polarization-dependent transmission yielded more accurate values of the absorption coefficient below the band edge of rutile. The 2-MGEM also measured the diattenuation, which is related to the birefringence, and other parameters but at near-normal incidence at a single wavelength (577 nm).
{"title":"Optical functions of uniaxial rutile and anatase (TiO2) revisited","authors":"G. Jellison, W. F. Cureton, O. Arteaga","doi":"10.1116/6.0003719","DOIUrl":"https://doi.org/10.1116/6.0003719","url":null,"abstract":"The optical functions of uniaxial rutile and anatase (TiO2) were determined from 200 to 850 nm (6.2 to 1.46 eV) using several of four optical techniques: (1) standard spectroscopic two-modulator generalized ellipsometry (2-MGE), (2) near-normal-incidence two-modulator generalized ellipsometry microscopy (2-MGEM), (3) Mueller matrix transmission of rutile, and (4) polarized transmission of rutile. The 2-MGE measurements yielded highly accurate values of the dielectric functions and error estimates from 1.46 to 6.2 eV, whereas the polarization-dependent transmission yielded more accurate values of the absorption coefficient below the band edge of rutile. The 2-MGEM also measured the diattenuation, which is related to the birefringence, and other parameters but at near-normal incidence at a single wavelength (577 nm).","PeriodicalId":505912,"journal":{"name":"Surface Science Spectra","volume":"29 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141646916","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is increasingly used to analyze cultural heritage materials because it can simultaneously detect organic and inorganic materials while mapping them on a surface. The precise identification of a pigment in a specific layer of a painting or of remaining color on a statue can inform about the technique used or the time of manufacture as well as expose possible forgeries when anachronistic ingredients are identified. Reference spectra are required to confidently identify a given pigment using ToF-SIMS. This paper focuses on eight pigments containing copper, zinc, arsenic, or phosphate, all manufactured following historical recipes. The positive polarity ToF-SIMS reference spectra using a Bi3 + primary ion species are presented here. Presented together, these spectra and corresponding tables of secondary ions provide a valuable help in differentiating these pigments, because copper, zinc, arsenic, or phosphate, combined with oxygen, share many mass interferences.
{"title":"Tof-SIMS spectra of historical inorganic pigments: Copper-, zinc-, arsenic-, and phosphorus-containing pigments in positive polarity","authors":"C. Bouvier, Sebastiaan Van Nuffel, Alain Brunelle","doi":"10.1116/6.0003722","DOIUrl":"https://doi.org/10.1116/6.0003722","url":null,"abstract":"Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is increasingly used to analyze cultural heritage materials because it can simultaneously detect organic and inorganic materials while mapping them on a surface. The precise identification of a pigment in a specific layer of a painting or of remaining color on a statue can inform about the technique used or the time of manufacture as well as expose possible forgeries when anachronistic ingredients are identified. Reference spectra are required to confidently identify a given pigment using ToF-SIMS. This paper focuses on eight pigments containing copper, zinc, arsenic, or phosphate, all manufactured following historical recipes. The positive polarity ToF-SIMS reference spectra using a Bi3 + primary ion species are presented here. Presented together, these spectra and corresponding tables of secondary ions provide a valuable help in differentiating these pigments, because copper, zinc, arsenic, or phosphate, combined with oxygen, share many mass interferences.","PeriodicalId":505912,"journal":{"name":"Surface Science Spectra","volume":"114 11","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141683593","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is increasingly used to analyze cultural heritage materials because it can simultaneously detect organic and inorganic materials while mapping them on a surface. The precise identification of a pigment in a specific layer of a painting or of remaining color on a statue can inform about the technique used or the time of manufacture as well as expose possible forgeries when anachronistic ingredients are identified. Reference spectra are required to confidently identify a given pigment using ToF-SIMS. This database focuses on six white pigments made from calcium-rich natural or synthetized materials, prepared following traditional processes. Such pigments are frequently found in the preparation layers, namely, “ground,” separating the support from the observable paint layers, and providing a smooth surface to hold the paint on while preventing its absorption by the substrate. Differentiating between these pigments is helpful to better describe the painting practice. Here, ToF-SIMS reference spectra using a Bi3+ primary ion species are presented for both polarities.
{"title":"Tof-SIMS spectra of historical inorganic pigments: Calcium white pigments in both polarities","authors":"C. Bouvier, Sebastiaan Van Nuffel, Alain Brunelle","doi":"10.1116/6.0003592","DOIUrl":"https://doi.org/10.1116/6.0003592","url":null,"abstract":"Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is increasingly used to analyze cultural heritage materials because it can simultaneously detect organic and inorganic materials while mapping them on a surface. The precise identification of a pigment in a specific layer of a painting or of remaining color on a statue can inform about the technique used or the time of manufacture as well as expose possible forgeries when anachronistic ingredients are identified. Reference spectra are required to confidently identify a given pigment using ToF-SIMS. This database focuses on six white pigments made from calcium-rich natural or synthetized materials, prepared following traditional processes. Such pigments are frequently found in the preparation layers, namely, “ground,” separating the support from the observable paint layers, and providing a smooth surface to hold the paint on while preventing its absorption by the substrate. Differentiating between these pigments is helpful to better describe the painting practice. Here, ToF-SIMS reference spectra using a Bi3+ primary ion species are presented for both polarities.","PeriodicalId":505912,"journal":{"name":"Surface Science Spectra","volume":"10 4","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141392292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The core-level aluminum excited spectra for lanthanum, the eponymous parent lanthanide metal, are presented together with exemplar spectra highlighting the metals reactivity from reaction with background chamber gases. Recommendations are given for the background integrations limits and form, together with comments on sensitivity factors.
{"title":"Core-level spectra of metallic lanthanides: Lanthanum (La)","authors":"D. Morgan","doi":"10.1116/6.0003602","DOIUrl":"https://doi.org/10.1116/6.0003602","url":null,"abstract":"The core-level aluminum excited spectra for lanthanum, the eponymous parent lanthanide metal, are presented together with exemplar spectra highlighting the metals reactivity from reaction with background chamber gases. Recommendations are given for the background integrations limits and form, together with comments on sensitivity factors.","PeriodicalId":505912,"journal":{"name":"Surface Science Spectra","volume":"31 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141399187","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Complex dielectric function (ɛ = ɛ1 + iɛ2) spectra of a heat treated single crystal yttria-stabilized zirconia (YSZ) have been determined over a spectral range of 0.03–8.5 eV using spectroscopic ellipsometry. Spectra are collected using three instruments covering different parts of the measured spectrum. The YSZ sample is modeled as a semi-infinite bulk crystal covered by a surface layer described by a Bruggeman effective medium approximation of equal parts YSZ and void.
{"title":"Optical properties of yttria-stabilized zirconia from spectroscopic ellipsometry","authors":"Emily Amonette, P. Dulal, M. Mainali, N. Podraza","doi":"10.1116/6.0003336","DOIUrl":"https://doi.org/10.1116/6.0003336","url":null,"abstract":"Complex dielectric function (ɛ = ɛ1 + iɛ2) spectra of a heat treated single crystal yttria-stabilized zirconia (YSZ) have been determined over a spectral range of 0.03–8.5 eV using spectroscopic ellipsometry. Spectra are collected using three instruments covering different parts of the measured spectrum. The YSZ sample is modeled as a semi-infinite bulk crystal covered by a surface layer described by a Bruggeman effective medium approximation of equal parts YSZ and void.","PeriodicalId":505912,"journal":{"name":"Surface Science Spectra","volume":"90 6","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140254178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Strange, Sudhir Ravula, Zihua Zhu, J. Bara, Ping Chen, D. Heldebrant, Jennifer Yao
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to analyze poly(ether ether ketone) (PEEK) based membranes. PEEK membranes have been shown to be effective in the separation of CO2 from flue gases (post-combustion technique). The PEEK membranes were synthesized using novel aromatic ether-ketone linkages inspired by PEEK with polymeric backbone bistriflimide [Tf2N]− counterions. One of the keys to advancing this technology is developing membranes that are selective and permeable toward CO2, in which PEEK based membranes have been shown to be. Furthermore, the compatibility between various water lean solvents also needs to be investigated. Surface analytical techniques such as x-ray photoelectron spectroscopy and ToF-SIMS are useful for investigating chemical changes between membranes. Herein, we present ToF-SIMS data obtained in the negative ion mode for four different PEEK membranes designed for use in CO2 capture systems. Positive ion mode spectra are reported in Paper I.
{"title":"In-house synthesized poly(ether ether ketone) ionenes. II. ToF-SIMS spectra in the negative ion mode","authors":"L. Strange, Sudhir Ravula, Zihua Zhu, J. Bara, Ping Chen, D. Heldebrant, Jennifer Yao","doi":"10.1116/6.0003133","DOIUrl":"https://doi.org/10.1116/6.0003133","url":null,"abstract":"Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to analyze poly(ether ether ketone) (PEEK) based membranes. PEEK membranes have been shown to be effective in the separation of CO2 from flue gases (post-combustion technique). The PEEK membranes were synthesized using novel aromatic ether-ketone linkages inspired by PEEK with polymeric backbone bistriflimide [Tf2N]− counterions. One of the keys to advancing this technology is developing membranes that are selective and permeable toward CO2, in which PEEK based membranes have been shown to be. Furthermore, the compatibility between various water lean solvents also needs to be investigated. Surface analytical techniques such as x-ray photoelectron spectroscopy and ToF-SIMS are useful for investigating chemical changes between membranes. Herein, we present ToF-SIMS data obtained in the negative ion mode for four different PEEK membranes designed for use in CO2 capture systems. Positive ion mode spectra are reported in Paper I.","PeriodicalId":505912,"journal":{"name":"Surface Science Spectra","volume":"96 19","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139784377","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Strange, D. Heldebrant, Sudhir Ravula, Ping Chen, Zihua Zhu, J. Bara, Jennifer Yao
Static time-of-flight secondary ion mass spectrometry (ToF-SIMS) was performed for acquiring the high-resolution surface spectra of four types of synthesized imidazolium ionene membranes. These novel membranes have aromatic ether–ketone–ether linkages inspired by poly(ether ether ketone) (PEEK). The PEEK-ionenes synthesized for this study have imidazolium cations placed in the polymeric backbone with bistriflimide [Tf2N]− counterions. The attention given to synthetically modified PEEK derivatives, such as PEEK-ionenes, is considerable due to their ability to selectively capture CO2 molecules and other light gases. Therefore, it is important to characterize the surface of these synthesized novel PEEK-ionenes. In this work, characteristic and unique peaks were identified in the positive spectra of each sample. The differences in mass spectra among the samples provide insights for optimizing or fine-tuning the PEEK-ionenes synthesis to achieve a high-performance CO2 separation membrane with enhanced permeability, selectivity, and mechanical stability. The SIMS spectra and identified characteristic peaks of these synthesized ionenes will serve as a reference in the positive mode, complementing the corresponding spectra reported in the negative ion mode (Paper II).
{"title":"In-house synthesized poly(ether ether ketone) ionenes. I. ToF-SIMS spectra in the positive ion mode","authors":"L. Strange, D. Heldebrant, Sudhir Ravula, Ping Chen, Zihua Zhu, J. Bara, Jennifer Yao","doi":"10.1116/6.0003132","DOIUrl":"https://doi.org/10.1116/6.0003132","url":null,"abstract":"Static time-of-flight secondary ion mass spectrometry (ToF-SIMS) was performed for acquiring the high-resolution surface spectra of four types of synthesized imidazolium ionene membranes. These novel membranes have aromatic ether–ketone–ether linkages inspired by poly(ether ether ketone) (PEEK). The PEEK-ionenes synthesized for this study have imidazolium cations placed in the polymeric backbone with bistriflimide [Tf2N]− counterions. The attention given to synthetically modified PEEK derivatives, such as PEEK-ionenes, is considerable due to their ability to selectively capture CO2 molecules and other light gases. Therefore, it is important to characterize the surface of these synthesized novel PEEK-ionenes. In this work, characteristic and unique peaks were identified in the positive spectra of each sample. The differences in mass spectra among the samples provide insights for optimizing or fine-tuning the PEEK-ionenes synthesis to achieve a high-performance CO2 separation membrane with enhanced permeability, selectivity, and mechanical stability. The SIMS spectra and identified characteristic peaks of these synthesized ionenes will serve as a reference in the positive mode, complementing the corresponding spectra reported in the negative ion mode (Paper II).","PeriodicalId":505912,"journal":{"name":"Surface Science Spectra","volume":"54 9","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139784105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Strange, Sudhir Ravula, Zihua Zhu, J. Bara, Ping Chen, D. Heldebrant, Jennifer Yao
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to analyze poly(ether ether ketone) (PEEK) based membranes. PEEK membranes have been shown to be effective in the separation of CO2 from flue gases (post-combustion technique). The PEEK membranes were synthesized using novel aromatic ether-ketone linkages inspired by PEEK with polymeric backbone bistriflimide [Tf2N]− counterions. One of the keys to advancing this technology is developing membranes that are selective and permeable toward CO2, in which PEEK based membranes have been shown to be. Furthermore, the compatibility between various water lean solvents also needs to be investigated. Surface analytical techniques such as x-ray photoelectron spectroscopy and ToF-SIMS are useful for investigating chemical changes between membranes. Herein, we present ToF-SIMS data obtained in the negative ion mode for four different PEEK membranes designed for use in CO2 capture systems. Positive ion mode spectra are reported in Paper I.
{"title":"In-house synthesized poly(ether ether ketone) ionenes. II. ToF-SIMS spectra in the negative ion mode","authors":"L. Strange, Sudhir Ravula, Zihua Zhu, J. Bara, Ping Chen, D. Heldebrant, Jennifer Yao","doi":"10.1116/6.0003133","DOIUrl":"https://doi.org/10.1116/6.0003133","url":null,"abstract":"Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to analyze poly(ether ether ketone) (PEEK) based membranes. PEEK membranes have been shown to be effective in the separation of CO2 from flue gases (post-combustion technique). The PEEK membranes were synthesized using novel aromatic ether-ketone linkages inspired by PEEK with polymeric backbone bistriflimide [Tf2N]− counterions. One of the keys to advancing this technology is developing membranes that are selective and permeable toward CO2, in which PEEK based membranes have been shown to be. Furthermore, the compatibility between various water lean solvents also needs to be investigated. Surface analytical techniques such as x-ray photoelectron spectroscopy and ToF-SIMS are useful for investigating chemical changes between membranes. Herein, we present ToF-SIMS data obtained in the negative ion mode for four different PEEK membranes designed for use in CO2 capture systems. Positive ion mode spectra are reported in Paper I.","PeriodicalId":505912,"journal":{"name":"Surface Science Spectra","volume":"65 6","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139844351","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Strange, D. Heldebrant, Sudhir Ravula, Ping Chen, Zihua Zhu, J. Bara, Jennifer Yao
Static time-of-flight secondary ion mass spectrometry (ToF-SIMS) was performed for acquiring the high-resolution surface spectra of four types of synthesized imidazolium ionene membranes. These novel membranes have aromatic ether–ketone–ether linkages inspired by poly(ether ether ketone) (PEEK). The PEEK-ionenes synthesized for this study have imidazolium cations placed in the polymeric backbone with bistriflimide [Tf2N]− counterions. The attention given to synthetically modified PEEK derivatives, such as PEEK-ionenes, is considerable due to their ability to selectively capture CO2 molecules and other light gases. Therefore, it is important to characterize the surface of these synthesized novel PEEK-ionenes. In this work, characteristic and unique peaks were identified in the positive spectra of each sample. The differences in mass spectra among the samples provide insights for optimizing or fine-tuning the PEEK-ionenes synthesis to achieve a high-performance CO2 separation membrane with enhanced permeability, selectivity, and mechanical stability. The SIMS spectra and identified characteristic peaks of these synthesized ionenes will serve as a reference in the positive mode, complementing the corresponding spectra reported in the negative ion mode (Paper II).
{"title":"In-house synthesized poly(ether ether ketone) ionenes. I. ToF-SIMS spectra in the positive ion mode","authors":"L. Strange, D. Heldebrant, Sudhir Ravula, Ping Chen, Zihua Zhu, J. Bara, Jennifer Yao","doi":"10.1116/6.0003132","DOIUrl":"https://doi.org/10.1116/6.0003132","url":null,"abstract":"Static time-of-flight secondary ion mass spectrometry (ToF-SIMS) was performed for acquiring the high-resolution surface spectra of four types of synthesized imidazolium ionene membranes. These novel membranes have aromatic ether–ketone–ether linkages inspired by poly(ether ether ketone) (PEEK). The PEEK-ionenes synthesized for this study have imidazolium cations placed in the polymeric backbone with bistriflimide [Tf2N]− counterions. The attention given to synthetically modified PEEK derivatives, such as PEEK-ionenes, is considerable due to their ability to selectively capture CO2 molecules and other light gases. Therefore, it is important to characterize the surface of these synthesized novel PEEK-ionenes. In this work, characteristic and unique peaks were identified in the positive spectra of each sample. The differences in mass spectra among the samples provide insights for optimizing or fine-tuning the PEEK-ionenes synthesis to achieve a high-performance CO2 separation membrane with enhanced permeability, selectivity, and mechanical stability. The SIMS spectra and identified characteristic peaks of these synthesized ionenes will serve as a reference in the positive mode, complementing the corresponding spectra reported in the negative ion mode (Paper II).","PeriodicalId":505912,"journal":{"name":"Surface Science Spectra","volume":"57 6","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139843739","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Spectroscopic ellipsometry and ultraviolet-visible (UV-VIS) spectrometry were utilized to study the optical properties of ferroelectric lead lanthanum zirconate titanate (PLZT) films. These films were deposited on platinized silicon [Si(100)/ SiO2/TiO2/Pt(111)] substrates using the chemical solution deposition method. Films were annealed at two different temperatures (650 and 750 °C) using rapid thermal annealing. Shimadzu UV-1800 UV-VIS spectrophotometer with a resolution of 1 nm was used to measure the reflectance data in the spectral range of 300–1000 nm with a step size of 1 nm. The bandgap values were determined from the reflectance spectra using appropriate equations. A J.A. Woollam RC2 small spot spectroscopic ellipsometer was used to obtain the change in amplitude (Ψ) and phase (Δ) of polarized light upon reflection from the film surface. The spectra were recorded in the wavelength range of 210–1500 nm at an incident angle of 65°. Refractive index (n) and extinction coefficient (k) were obtained by fitting the spectra (Ψ, Δ) with the appropriate models. No significant changes were observed in the optical constants of PLZT films annealed at 650 and 750 °C. The optical transparency and the strong absorption in the ultraviolet (UV) region of PLZT films make them an attractive material for optoelectronic and UV sensing applications.
{"title":"Spectroscopic analysis of lead lanthanum zirconate titanate films using UV-VIS and ellipsometry","authors":"S. Kotru, Sneha Kothapally, J. Hilfiker","doi":"10.1116/6.0002972","DOIUrl":"https://doi.org/10.1116/6.0002972","url":null,"abstract":"Spectroscopic ellipsometry and ultraviolet-visible (UV-VIS) spectrometry were utilized to study the optical properties of ferroelectric lead lanthanum zirconate titanate (PLZT) films. These films were deposited on platinized silicon [Si(100)/ SiO2/TiO2/Pt(111)] substrates using the chemical solution deposition method. Films were annealed at two different temperatures (650 and 750 °C) using rapid thermal annealing. Shimadzu UV-1800 UV-VIS spectrophotometer with a resolution of 1 nm was used to measure the reflectance data in the spectral range of 300–1000 nm with a step size of 1 nm. The bandgap values were determined from the reflectance spectra using appropriate equations. A J.A. Woollam RC2 small spot spectroscopic ellipsometer was used to obtain the change in amplitude (Ψ) and phase (Δ) of polarized light upon reflection from the film surface. The spectra were recorded in the wavelength range of 210–1500 nm at an incident angle of 65°. Refractive index (n) and extinction coefficient (k) were obtained by fitting the spectra (Ψ, Δ) with the appropriate models. No significant changes were observed in the optical constants of PLZT films annealed at 650 and 750 °C. The optical transparency and the strong absorption in the ultraviolet (UV) region of PLZT films make them an attractive material for optoelectronic and UV sensing applications.","PeriodicalId":505912,"journal":{"name":"Surface Science Spectra","volume":"34 6","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139863796","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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