{"title":"使用多特质表征的双量表 BERT,用于整体和特质作文评分","authors":"Minsoo Cho, Jin-Xia Huang, Oh-Woog Kwon","doi":"10.4218/etrij.2023-0324","DOIUrl":null,"url":null,"abstract":"<p>As automated essay scoring (AES) has progressed from handcrafted techniques to deep learning, holistic scoring capabilities have merged. However, specific trait assessment remains a challenge because of the limited depth of earlier methods in modeling dual assessments for holistic and multi-trait tasks. To overcome this challenge, we explore providing comprehensive feedback while modeling the interconnections between holistic and trait representations. We introduce the DualBERT-Trans-CNN model, which combines transformer-based representations with a novel dual-scale bidirectional encoder representations from transformers (BERT) encoding approach at the document-level. By explicitly leveraging multi-trait representations in a multi-task learning (MTL) framework, our DualBERT-Trans-CNN emphasizes the interrelation between holistic and trait-based score predictions, aiming for improved accuracy. For validation, we conducted extensive tests on the ASAP++ and TOEFL11 datasets. Against models of the same MTL setting, ours showed a 2.0% increase in its holistic score. Additionally, compared with single-task learning (STL) models, ours demonstrated a 3.6% enhancement in average multi-trait performance on the ASAP++ dataset.</p>","PeriodicalId":11901,"journal":{"name":"ETRI Journal","volume":"46 1","pages":"82-95"},"PeriodicalIF":1.3000,"publicationDate":"2024-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.4218/etrij.2023-0324","citationCount":"0","resultStr":"{\"title\":\"Dual-scale BERT using multi-trait representations for holistic and trait-specific essay grading\",\"authors\":\"Minsoo Cho, Jin-Xia Huang, Oh-Woog Kwon\",\"doi\":\"10.4218/etrij.2023-0324\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>As automated essay scoring (AES) has progressed from handcrafted techniques to deep learning, holistic scoring capabilities have merged. However, specific trait assessment remains a challenge because of the limited depth of earlier methods in modeling dual assessments for holistic and multi-trait tasks. To overcome this challenge, we explore providing comprehensive feedback while modeling the interconnections between holistic and trait representations. We introduce the DualBERT-Trans-CNN model, which combines transformer-based representations with a novel dual-scale bidirectional encoder representations from transformers (BERT) encoding approach at the document-level. By explicitly leveraging multi-trait representations in a multi-task learning (MTL) framework, our DualBERT-Trans-CNN emphasizes the interrelation between holistic and trait-based score predictions, aiming for improved accuracy. For validation, we conducted extensive tests on the ASAP++ and TOEFL11 datasets. Against models of the same MTL setting, ours showed a 2.0% increase in its holistic score. Additionally, compared with single-task learning (STL) models, ours demonstrated a 3.6% enhancement in average multi-trait performance on the ASAP++ dataset.</p>\",\"PeriodicalId\":11901,\"journal\":{\"name\":\"ETRI Journal\",\"volume\":\"46 1\",\"pages\":\"82-95\"},\"PeriodicalIF\":1.3000,\"publicationDate\":\"2024-02-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://onlinelibrary.wiley.com/doi/epdf/10.4218/etrij.2023-0324\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ETRI Journal\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.4218/etrij.2023-0324\",\"RegionNum\":4,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ETRI Journal","FirstCategoryId":"94","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.4218/etrij.2023-0324","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Dual-scale BERT using multi-trait representations for holistic and trait-specific essay grading
As automated essay scoring (AES) has progressed from handcrafted techniques to deep learning, holistic scoring capabilities have merged. However, specific trait assessment remains a challenge because of the limited depth of earlier methods in modeling dual assessments for holistic and multi-trait tasks. To overcome this challenge, we explore providing comprehensive feedback while modeling the interconnections between holistic and trait representations. We introduce the DualBERT-Trans-CNN model, which combines transformer-based representations with a novel dual-scale bidirectional encoder representations from transformers (BERT) encoding approach at the document-level. By explicitly leveraging multi-trait representations in a multi-task learning (MTL) framework, our DualBERT-Trans-CNN emphasizes the interrelation between holistic and trait-based score predictions, aiming for improved accuracy. For validation, we conducted extensive tests on the ASAP++ and TOEFL11 datasets. Against models of the same MTL setting, ours showed a 2.0% increase in its holistic score. Additionally, compared with single-task learning (STL) models, ours demonstrated a 3.6% enhancement in average multi-trait performance on the ASAP++ dataset.
期刊介绍:
ETRI Journal is an international, peer-reviewed multidisciplinary journal published bimonthly in English. The main focus of the journal is to provide an open forum to exchange innovative ideas and technology in the fields of information, telecommunications, and electronics.
Key topics of interest include high-performance computing, big data analytics, cloud computing, multimedia technology, communication networks and services, wireless communications and mobile computing, material and component technology, as well as security.
With an international editorial committee and experts from around the world as reviewers, ETRI Journal publishes high-quality research papers on the latest and best developments from the global community.